Cascade Microtech, Inc.

Company Information

Company Name
Cascade Microtech, Inc.
Address
14255 SW BRIGADOON COURT
Beaverton, OR, 97005
Phone
n/a
URL
n/a
DUNS
n/a
Number of Employees
n/a

Award Totals

PROGRAM/PHASE
AWARD AMOUNT ($)
NUMBER OF AWARDS
SBIR Phase I
$475,239.00
8
SBIR Phase II
$246,913.00
1
Chart code to be here

Award List

  1. HIGH ACCURACY CHARACTERIZATION OF MONOLITHIC MILLIMETER-WAVEDEVICES

    Amount: $49,737.00

    MAKING ACCURATE ON WAFER MEASUREMENTS OF MILLIMETER WAVE SEMICONDUCTOR DEVICES AND CIRCUIT ELEMENTS IS A FUNDAMENTAL REQUIREMENT FOR THE ADVANCEMENT OF MILLIMETER WAVE TECHNOLOGY. MILLIMETER WAVE WAFE ...

    SBIR Phase I 1987 National Aeronautics and Space Administration
  2. NONINVASIVE ELECTRO-OPTIC PROBING FOR MMIC

    Amount: $120,730.00

    THERE IS AN IMPLICIT NEED FOR THE ABILITY TO PROBE INTERNAL NODES IN GAAS MMIC'S TO FACILITATE DEVELOPMENT OF THESE STRATEGICALLY CRITICAL COMPONENTS. SYSTEMS USING THE ELECTRO-OPTIC EFFECT HAVE DEMON ...

    SBIR Phase I 1987 Air ForceDepartment of Defense
  3. LOW LOSS MILLIMETER-WAVE SEMICONDUCTOR WAFER PROBES

    Amount: $57,489.00

    MAKING ACCURATE AUTOMATED ON-WAFER MEASUREMENTS OF MILLIMETER-WAVE SEMICONDUCTOR DEVICES AND CIRCUIT ELEMENTS IS A FUNDAMENTAL REQUIREMENT FOR THE ADVANCEMENT OF A MILLIMETER-WAVE TECHNOLOGY. MILLIMET ...

    SBIR Phase I 1987 ArmyDepartment of Defense
  4. MULTI-GIGAHERTZ BANDWIDTH HIGH PINOUT DENSITY WAFER PROBE

    Amount: $49,866.00

    A MEMBRANE TYPE WAFER PROBE IS PROPOSED WHICH, AT THE END OF PHASE II, WILL ACHIEVE TRANSMISSION OF SIGNALS FROM TESTER TO DIE WITH LOW ABBRATIONS FOR A 100 PS RISETIME. CAPABILITIES WILL INCLUDE LOW- ...

    SBIR Phase I 1989 Defense Advanced Research Projects AgencyDepartment of Defense
  5. 110 GHZ ON-WAFER MEASUREMENTS AND ELEMENT MODELING

    Amount: $49,961.00

    ON-WAFER MICROWAVE PROBE MEASUREMENTS HAVE DEMONSTRATED THEIR UNIQUE PERFORMANCE AND PRODUCTIVITY GAINS IN SEMICONDUCTOR RESEARCH, DEVELOPMENT AND PRODUCTION ACTIVITIES. HOWEVER, DEVICE PERFORMANCE CO ...

    SBIR Phase I 1990 Defense Advanced Research Projects AgencyDepartment of Defense
  6. APPLICATION OF GIGAHERTZ WAFER PROBE TECHNOLOGY TO MULTICHIP MODULE PRODUCTION

    Amount: $246,913.00

    ADAPTATION OF STATE-OF-THE-ART GIGAHERTZ WAFER PROBE TECHNOLOGY (WPT) FOR USE IN DESIGN, TROUBLESHOOTING, AND PRODUCTION OF MULTICHIP MODULES (MCMS) IS PROPOSED. THESE PROBES ARE CURRENTLY CAPABLE OF ...

    SBIR Phase II 1993 Defense Advanced Research Projects AgencyDepartment of Defense
  7. LOW-LOSS MICROWAVE PROBES FOR NOISE PARAMETER MEASUREMENTS

    Amount: $49,999.00

    NOISE PARAMETER MEASUREMENTS OF MICROWAVE TRANSISTORS AND MMICS ARE BEST PERFORMED WITH ON-WAFER, PROBE SYSTEMS. TWO KEY PARAMETERS OF THESE SYSTEMS IS THE LOSS FROM THE INPUT TUNER TO THE DEVICE UNDE ...

    SBIR Phase I 1991 Air ForceDepartment of Defense
  8. On-Wafer Measurement Accuracy Assessment Tool Kit

    Amount: $49,848.00

    The traceability of on-wafer calibration standards has long been an issue among the microwave measurement community, and the proliferation of new calibration methods, elements, and applications only e ...

    SBIR Phase I 1995 Department of Commerce
  9. APPLICATION OF GIGAHERTZ WAFER PROBE TECHNOLOGY TO MULTICHIP MODULE PRODUCTION

    Amount: $47,609.00

    N/A

    SBIR Phase I 1991 Defense Advanced Research Projects AgencyDepartment of Defense

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