LOW-LOSS MICROWAVE PROBES FOR NOISE PARAMETER MEASUREMENTS

Award Information
Agency:
Department of Defense
Branch:
Air Force
Amount:
$49,999.00
Award Year:
1991
Program:
SBIR
Phase:
Phase I
Contract:
N/A
Agency Tracking Number:
14881
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Cascade Microtech Inc
14255 Sw Brigadoon Ct, Beaverton, OR, 97005
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
N/A
Principal Investigator
 Ed Godshalk
 Principal Investigator
 (503) 626-8245
Business Contact
Phone: () -
Research Institution
N/A
Abstract
NOISE PARAMETER MEASUREMENTS OF MICROWAVE TRANSISTORS AND MMICS ARE BEST PERFORMED WITH ON-WAFER, PROBE SYSTEMS. TWO KEY PARAMETERS OF THESE SYSTEMS IS THE LOSS FROM THE INPUT TUNER TO THE DEVICE UNDER TEST (DUT), AND FROM THE DUT TO THE RECEIVER; THIS IS TYPICALLY DOMINATED BY THE WAFER PROBE. THIS PHASE I WORK WILL DEMONSTRATE A WAFER PROBE PROTOYPE WITH SIGNIFICANTLY LOWER LOSS THAN CURRENTLY AVAILVABLE, WHILE MAINTAINING LOW RETURN LOSS AND HIGH ACCURACY.

* information listed above is at the time of submission.

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