DEVELOPMENT OF A MICROCIRCUIT GRID TECHNIQUE FOR AUTOMATED CRACK LENGTH MEASUREMENT FOR FATIGUE TESTING AT ELEVATED TEMPERATURES

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$49,959.00
Award Year:
1987
Program:
SBIR
Phase:
Phase I
Contract:
n/a
Award Id:
5631
Agency Tracking Number:
5631
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
2425 S 900rd W, Salt Lake City, UT, 84119
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
RAYMOND A CULTER
(801) 486-5071
Business Contact:
() -
Research Institution:
n/a
Abstract
DEVELOPMENT AND APPLICATION OF A MICROCIRCUIT GRID TECHNIQUE FOR MEASURING CRACK LENGTHS IN FATIGUE CRACK GROWTH TEST SPECIMENS IS DESCRIBED. CRACK LENGTH IS DETERMINED FROM STEPWISE CHANGES IN THE VOLTAGE OUTPUT OF THE GRID CIRCUIT CAUSED BY THE SEQUENTIAL RUPTURE OF THE MICROSTRIPS BY THE ADVANCING CRACK TIP. THE ADVANTAGES OF THE GRID TECHNIQUE AS COMPARED TO OTHER TECHNIQUES FOR MONITORING CRACK LENGTHS INCLUDE: HIGH CRACK LENGTH RESOLUTION ( M) MADE POSSIBLE BY TODAY'S ADVANCED MICROCIRCUIT TECHNOLOGY, APPLICABILITY AT ELEVATED TEMPERATURES (1200 C) BY AN APPROPRIATED SELECTION OF THE CONDUCTING METAL STRIPS, LACK OF A NEED FOR QUANTITATIVE CALIBRATION OF THE VOLTAGE OUTPUT, AND THE COMPATIBILITY TO AUTOMATE THE DATA ACQUISITION AND ANALYSIS. DIRECT COMPARISON OF FATIGUE CRACK GROWTH RATES IN METALLIC SPECIMENS MEASURED BY THE GRID TECHNIQUE AND OTHER TECHNIQUES AND THE DEVELOPMENT OF A MULTIPLE GRID TECHNIQUE ARE THE OBJECTIVES OF THE PHASE I EFFORT.

* information listed above is at the time of submission.

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