Early Warning Aircraft Damage Detection Using Electronic Laser Speckle Pattern Interferometry

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: N/A
Agency Tracking Number: 32213
Amount: $746,272.00
Phase: Phase II
Program: SBIR
Awards Year: 1997
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
1919 Green Road Suite B-101, Ann Arbor, MI, 48105
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Lou X., Chen, Ph.d.
 (313) 668-2567
Business Contact
Phone: () -
Research Institution
Cybernet Systems Corporation (CSC) proposes to develop an easy-to-use, fast, and nondestructive tool to detect areas of damage in aerospace vehicles. After extensive literature study and from our experience, this tool will be based on electronic laser speckle pattern interferometry/shearography techniques. These techniques can quickly and cost effectively find the locations of damage/flaws. They are non-contacting, fast, sensitive to wide a variety of flaws/damage, and they have a direct data connection with computer systems. Two techniques will be investigated, namely ESPI (electronic speckle pattern interferometry) and ESPS (electronic speckle pattern shearography). ESPI and ESPS measure the displacement and the derivative of the displacement respectively. Unlike ultrasonics and x-ray techniques. loading (stressing) is an essential part of nondestructive inspection (NDI) processes using ESPI and ESPS techniques. The loading provides a very important connection between the detected damage/flaw and the effect of the flaws/damage on the integrity and strength of the structures. The main goal of the proposed Phase I effort will outline a test plan of demonstrating the technology on a small structure. During the project, a compat optical head using advanced fiber optics technologies and a laser diode, loading methods, and related software would be developed to support this goal.

* Information listed above is at the time of submission. *

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