Portable and Automated Radiation Effects Test Structures for Advanced Technology Nodes

Award Information
Agency: Department of Defense
Branch: Defense Threat Reduction Agency
Contract: HDTRA1-16-P-0046
Agency Tracking Number: T16A-003-0006
Amount: $149,948.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: DTRA16A-003
Solicitation Number: 2016.0
Timeline
Solicitation Year: 2016
Award Year: 2016
Award Start Date (Proposal Award Date): 2016-09-15
Award End Date (Contract End Date): 2017-04-14
Small Business Information
4775 Centennial Boulevard, Suite 130, Colorado Springs, CO, 80919-Array
DUNS: 619085371
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Mr. Paul Eaton
 (505) 296-2996
 paul.eaton@micro-rdc.com
Business Contact
 Ms. Karen Van Cura
Phone: (719) 531-0805
Email: karen.vancura@micro-rdc.com
Research Institution
 Arizona State University
 Dr. Lawrence Clark
 Office of Research and Sponsored Project Administration
660 South Mill Avenue, Suite 312
Tempe, AZ, 85287
 (480) 727-0295
 Nonprofit college or university
Abstract
Micro-RDC will develop portable radiation effects test structures that scales to new process nodes. These structures will enable the investigation of the effects of radiation on the new technology from the material processing level as well as the circuit level. The production of the chosen structures and the development of software to extract the model parameters will form the framework. A suite of test structures will be developed which provide data that can be used to create the model parameters with coverage for the variety of transistor geometries commonly used in the process. This effort will focus on generating the correct structure and structure sizing to provide electrical characterization over Total Ionizing Dose and Single Event Effects. The extracted parameters from the chosen test structures will allow for the construction of accurate simulation models. Subscribers will be able to predict radiation effects without having to run expensive test chips. This effort will appeal to programs needing efficiency in schedule and budget for aerospace end users. Due to the expense of advanced nodes, the cost savings represented by program developed technology will have a significant licensing demand. The licensed technology will be provided as an extension to the Foundry PDK.

* Information listed above is at the time of submission. *

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