You are here

A New Paradigm for X-ray Optics Nanopositioning

Award Information
Agency: Department of Energy
Branch: N/A
Contract: N/A
Agency Tracking Number: 94337
Amount: $99,857.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: 18 a
Solicitation Number: DE-FOA-0000161
Timeline
Solicitation Year: 2010
Award Year: 2010
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): 2011-03-18
Small Business Information
1025 West Vernon Park Place Unit A
Chicago, IL 60607
United States
DUNS: 828626221
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Curt Preissner
 Dr.
 (630) 252-3020
 troyston@uic.edu
Business Contact
 Thomas Royston
Title: Dr.
Phone: (312) 413-7951
Email: troyston@uic.edu
Research Institution
 Argonne National Laboratory
 John Quintana
 
9700 South Cass Avenue Bldg 401
Argonne, IL 60439
United States

 (630) 252-6716
 Federally Funded R&D Center (FFRDC)
Abstract

High resolution X-ray microscopy using synchrotron radiation is a key scientific technique in materials research that has provided insight into the atomic structure of bulk materials, surfaces, interfaces, nanoparticles, nanostructures, and nanodomains. Such detailed understanding into the characterization and behavior of matter allows scientists and engineers to design materials with longer fatigue lives, higher strengths, and better wear characteristics. A better understanding of materials results in more efficient use of those materials: more effective materials usage in automobile manufacture, more capable semiconductor devices for the IT revolution, and more efficient catalysts for fuel cells, for example. DOE synchrotrons serve a user community of academic, government, and industrial users. The Advanced Photon Source alone serves over 5000 scientists. At these facilities, the need for nanometer resolution X-ray microscopes continues to grow, as does the desire for higher resolution probes. While novel X-ray optics are being developed that will be able to focus an X-ray beam to nanometer spot sizes, state of the art positioning systems are not capable of the corresponding subnanometer resolution necessary to position the optics or samples to take advantage of this. We are addressing this need by developing an X-ray optic positioning system with subnanometer resolution. This problem will be addressed by developing a positioning system built around a novel type of parallel kinematics, multi-axis flexure based stage

* Information listed above is at the time of submission. *

US Flag An Official Website of the United States Government