Celadon Systems Inc.

Basic Information

14763 Energy Way
Apple Valley, MN, 55124

Company Profile

n/a

Additional Details

Field Value
DUNS: 111765657
Hubzone Owned: N
Socially and Economically Disadvantaged: N
Woman Owned: N
Number of Employees: 25


  1. Massively Parallel High Temperature Probe System for Wafer-level Reliability Testing

    Amount: $300,000.00

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Larger sample sizes and longer duration tests are increasingly needed. At the same time, efforts to con ...

    SBIR Phase II 2011 National Institute of Standards and Technology Department of Commerce
  2. 300 mm High Density Temperature Probe Card for Wafer- Level Reliability Testing

    Amount: $90,000.00

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Already researchers are unable to package the many advanced devices because the act of cutting the wafe ...

    SBIR Phase I 2010 National Institute of Standards and Technology Department of Commerce

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