Celadon Systems Inc.

Address

14763 Energy Way
Apple Valley, MN, 55124

Information

DUNS: 111765657
# of Employees: 25

Ownership Information

Hubzone Owned: N
Socially and Economically Disadvantaged: N
Woman Owned: N

Award Charts




Award Listing

  1. Massively Parallel High Temperature Probe System for Wafer-level Reliability Testing

    Amount: $300,000.00

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Larger sample sizes and longer duration tests are increasingly needed. At the same time, efforts to con ...

    SBIRPhase II2011National Institute of Standards and Technology Department of Commerce
  2. 300 mm High Density Temperature Probe Card for Wafer- Level Reliability Testing

    Amount: $90,000.00

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Already researchers are unable to package the many advanced devices because the act of cutting the wafe ...

    SBIRPhase I2010National Institute of Standards and Technology Department of Commerce

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