You are here

Concurrent Generation of Test Data During Design and Production

Award Information
Agency: Department of Defense
Branch: Navy
Contract: N/A
Agency Tracking Number: 25457
Amount: $729,113.00
Phase: Phase II
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1998
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
3810 Concorde Parkway, Suite 2200
Chantilly, VA 22021
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Stephen Dallas
 (703) 817-0604
Business Contact
Phone: () -
Research Institution
N/A
Abstract

Significant savings in system life cycle costs can be realized when common Automated Test Systems (ATS) are used to meet both system production and field maintenance needs. Additional cost avoidance and quality gains are the result of transitioning the "lessons learned," and test maturity gained during manufacturing in-process and system acceptance (sell-off) testing to the maintenance environment. This study investigates the feasibility of exploiting common ATS hardware and software architecture/interfaces to meet both factory and field maiantenance test requirements. The study considers the utilization of computer-aided design, manufacturing and engineering (CAD/CAM/CAE) test information, commercially developed test technologies, and DoD ATS commercial equivalents integrated into a test requirements capture/creation framework. The strategy for the study includes looking into the test engineering business processes within an actual avionics developer and application of the draft ABBET standards and other applicable test engineering standards. A conceptual system definition for a prototype framework and work plan for its development are part of the study report. Anticipated Benefits: The concept of implementing a framework which integrated and enables better utilization of CAD/CAM/CAE test information to generate ATE applications which support both factory and field testing, can enhance the competitiveness of any defense electronics firm. The concept is also applicable to any electronic equipment manufacturer in the aerospace, automotive and other commercial sectors.

* Information listed above is at the time of submission. *

US Flag An Official Website of the United States Government