k-Space Associates, Inc.

Address

2182 Bishop Circle East
Dexter, MI, 48130

http://www.k-space.com

Information

DUNS: 801558578
# of Employees: 22

Ownership Information

Hubzone Owned: N
Socially and Economically Disadvantaged: N
Woman Owned: N

Award Charts




Award Listing

  1. Advanced, High-Sensitivity, Multi-Species, In-Situ Film Growth Monitor Utilizing Atomic Absorption Spectroscopy

    Amount: $964,128.00

    Advanced thin-film multilayer x-ray optics such as multilayer Laue lenses (MLLs) are typically fabricated using physical vapor deposition (PVD) processes. Such optics play a critical role in the appli ...

    SBIRPhase II2016Department of Energy
  2. Advanced, High-Sensitivity, Multi-Species, In-Situ Film Growth Monitor Utilizing Atomic Absorption Spectroscopy

    Amount: $148,623.00

    Advanced thin-film multilayer x-ray optics such as multilayer Laue lenses (MLLs) are typically fabricated using physical vapor deposition (PVD) processes. Such optics play a critical role in the appli ...

    SBIRPhase I2015Department of Energy
  3. In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.

    Amount: $723,505.00

    An integrated, in-situ, real-time, optical metrology system will be developed to measure temperature, film stress and reflectivity during CdTe and HgCdTe-based deposition applications. Temperature mea ...

    SBIRPhase II2011Department of Defense
  4. In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.

    Amount: $69,571.00

    The feasibility of an in-situ, real-time, non-contact system for optically monitoring temperature in the range 25-800C on Si, GaAs, and CdTe-buffered Si/GaAs substrates will be demonstrated. Real-time ...

    SBIRPhase I2010Army Department of Defense

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