In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$69,571.00
Award Year:
2010
Program:
SBIR
Phase:
Phase I
Contract:
W909MY-10-C-0034
Agency Tracking Number:
A093-151-0221
Solicitation Year:
2009
Solicitation Topic Code:
A09-151
Solicitation Number:
2009.3
Small Business Information
k-Space Associates, Inc.
2182 Bishop Circle East, Dexter, MI, 48130
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
801558578
Principal Investigator:
Charles Taylor
Product Development Manager
(734) 426-7977
cataylor@k-space.com
Business Contact:
Darryl Barlett
General Manager
(734) 426-7977
brian.english@engeniusmicro.com
Research Institution:
n/a
Abstract
The feasibility of an in-situ, real-time, non-contact system for optically monitoring temperature in the range 25-800C on Si, GaAs, and CdTe-buffered Si/GaAs substrates will be demonstrated. Real-time measurement of thin-film stress and surface reflectivity during deposition on these substrates, including samples provided by NVESD, will also be developed. Temperature measurement will be performed via band-edge thermometry and blackbody radiation analysis, while stress and reflectivity measurement will be made using an etalon-based multiple laser array approach. Data acquisition will be home-pulse triggered, with provisions made for the non-integer shaft-to-stage rotation ratio of V80H MBE reactors.

* information listed above is at the time of submission.

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