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Multi-Attribute Circuit Authentication and Reliability Techniques

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8650-16-M-1789
Agency Tracking Number: F161-140-0919
Amount: $149,992.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: AF161-140
Solicitation Number: 2016.1
Solicitation Year: 2016
Award Year: 2016
Award Start Date (Proposal Award Date): 2016-06-10
Award End Date (Contract End Date): 2017-03-09
Small Business Information
7735 Paragon Rd.
Dayton, OH 45459
United States
DUNS: 134159925
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Thomas Kent
 (614) 947-7345
Business Contact
 Marylyn Fortson
Phone: (937) 435-9374
Research Institution

ABSTRACT: Our goal for a successful Phase 1 and 2 SBIR effort is to develop a design and measurement methodology for RF microelectronic components which enables real time, non-invasive authentication and reliability determination. Our unique and innovative approach will authenticate components using statistical analysis of characteristic electromagnetic and functional fingerprints exhibited at external nodes. Specifically, this proposal describes an approach to uncover variation sensitive circuit nodes in state-of-the-art Low Noise Amplifiers (LNAs), Voltage Controlled Oscillators (VCOs), and Active Mixers. We outline configuration methodologies that amplify process differences to statistically enhance the process differences without resulting in significant performance or circuit area penalties. We also propose evaluation of these methodologies for their ability to exhibit transistor wear characteristics over the circuits operational lifetime. Finally, we propose measurements of existing state-of-the-art fabricated VCOs in multiple technology nodes to determine out-of-the-box measures of performance variation for comparison. These measurements consist of EM signal injection into various circuit nodes to observe the statistical variation produced from parts from the identical fabrication run.; BENEFIT: The BRC-OSU team anticipates that the circuit authentication technologies developed under this effort will have high commercialization potential in the private sector supporting both DoD and commercial customers. Our team recognizes the need for a circuit authentication and reliability determination technology that is able to rapidly and non-destructively evaluate the authenticity and reliability of whole production lots of microelectronic components with sensitivity to advanced counterfeit, subversively modified and aged devices and will tailor the technology developed under this program to these unique needs of the high reliability commercial and DoD market. Our team anticipates that this unique approach will be of high interest primarily to DoD end users (prime contractors and armed services) as well as original component manufacturers. Our team envisions offering a product for sale only to DoD end users and original component manufacturers to ensure the integrity of the measurement system against reverse engineering by foreign entities.

* Information listed above is at the time of submission. *

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