MICROCIRCUITS

Award Information
Agency: Department of Defense
Branch: Navy
Contract: N/A
Agency Tracking Number: 2304
Amount: $49,670.00
Phase: Phase I
Program: SBIR
Awards Year: 1985
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
Dataspan Inc
3645 California Rd, Orchard Park, NY, 14127
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 DR C MICHAEL ALLEN
 (716) 662-5360
Business Contact
Phone: () -
Research Institution
N/A
Abstract
THE EFFECTS OF NEGATIVE VOLTAGE PULSES (RESULTING FROM SIGNAL REFLECTIONS) ON THE INPUT SIGNAL PINS OF NMOS TECHNOLOGY MICROCIRCUITS ARE LARGELY UNKNOWN. THIS PHASE I PROPOSAL EXPLORES THE FEASIBILITY OF AN EXTENSIVE TEST AND EVALUATION PROGRAM TO DETERMINE THE SHORT-TERM AND LONG-TERM EFFECTS ON PERFORMANCE AND RELIABILITY DEGRADATION. THE PROGRAMS WILL EXAMINE THE EFFECTS OF NEGATIVE VOLTAGE PULSE AMPLITUDE AND DURATION, PULSE RISE/FALL-TIMES, AND PULSE REPETITION RATES ON NMOS DYNAMIC RAM MICROCIRCUIT ANTICIPATED RESULTS INCLUDE: 1) AN ACCURATE CHARACTERIZATION OF THE EFFECT OF THOSE PARAMETERS RELATED TO UNDERSHOOT IN NMOS MICROCIRCUITS, AND 2) PRELIMINARY WORK TOWARD THE DESIGN OF AN INPUT STRUCTURE WHICH MINIMIZES THE SUSCEPTIBILITY OF NMOS DEVICES TO THOSE EFFECTS. BASED UPON THESE RESULTS SUGGESTIONS WILL BE MADE FOR: MINIMIZING THE EFFECTS OF UNDERSHOOT IN BOTH EXISTING CIRCUITS AND SYSTEMS; NEW DESIGNS FOR BOTH MILITARY AND COMMERCIAL APPLICATIONS.

* information listed above is at the time of submission.

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