Automated Generation of Advanced Test Diagrams to Reduce Test Program Set Life-Cycle Costs

Award Information
Agency:
Department of Defense
Branch
Navy
Amount:
$79,595.00
Award Year:
2010
Program:
SBIR
Phase:
Phase I
Contract:
N68335-10-C-0287
Agency Tracking Number:
N101-029-0915
Solicitation Year:
2010
Solicitation Topic Code:
N101-029
Solicitation Number:
2010.1
Small Business Information
Diamond Glen Software
4316 Marina City Dr, Unit 831, Marina del Rey, CA, 90292
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
Y
Duns:
024656261
Principal Investigator:
Geoffrey Ingram
Principal Investigator
(310) 821-2395
geoff@diamondglen.com
Business Contact:
Dianne Shook
CEO
(310) 821-2395
dshook@diamondglen.com
Research Institution:
n/a
Abstract
The three Key Personnel dedicated to the investigation/analysis for this SBIR N101-029 proposal have already designed and developed a working automatic Test Diagram Generator, which we called TDGen. TDGen generated thousands of Test Diagrams for fifteen C130 METS TPSs. The new version of TDGen as a result of this feasibility study will be named the Dynamic Test Diagram Generator (D-TDGen). This proposal will describe the process by which Diamond Glen Software will investigate the feasibility of using ATML as the input to D-TDGen and the inclusion of stimulus and measurement signal parameters in the D-TDGen Test Diagrams. Our previous experience in developing the C130 METS TDGEN product results in minimal risk and a high probability of success in the design and development of the new and improved Dynamic Test Diagram Generator (D-TDGen).

* information listed above is at the time of submission.

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