Automated Generation of Advanced Test Diagrams to Reduce Test Program Set Life-Cycle Costs
Small Business Information
Diamond Glen Software
4316 Marina City Dr, Unit 831, Marina del Rey, CA, 90292
AbstractThe three Key Personnel dedicated to the investigation/analysis for this SBIR N101-029 proposal have already designed and developed a working automatic Test Diagram Generator, which we called TDGen. TDGen generated thousands of Test Diagrams for fifteen C130 METS TPSs. The new version of TDGen as a result of this feasibility study will be named the Dynamic Test Diagram Generator (D-TDGen). This proposal will describe the process by which Diamond Glen Software will investigate the feasibility of using ATML as the input to D-TDGen and the inclusion of stimulus and measurement signal parameters in the D-TDGen Test Diagrams. Our previous experience in developing the C130 METS TDGEN product results in minimal risk and a high probability of success in the design and development of the new and improved Dynamic Test Diagram Generator (D-TDGen).
* information listed above is at the time of submission.