Rapid Non-destructive Detection of Advanced Counterfeit Electronic Material

Rapid Non-destructive Detection of Advanced Counterfeit Electronic Material

Award Information
Agency: Department of Defense
Branch: Defense Microelectronics Activity
Contract: HQ072717C0004
Agency Tracking Number: E2-0039
Amount: $412,000.00
Phase: Phase II
Program: SBIR
Awards Year: 2017
Solicitation Year: 2015
Solicitation Topic Code: DMEA152-001
Solicitation Number: 2015.2
Small Business Information
310 5th Street, Charleroi, PA, 15022
DUNS: 187594788
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Andrew Portune
 (724) 483-3946
 aportune@nokomisinc.com
Business Contact
 Gena Johnson
Phone: (724) 483-3946
Email: gjohnson@nokomisinc.com
Research Institution
N/A
Abstract
Counterfeit and maliciously modified electronics can disrupt, disable, and subvert Department of Defense (DoD) weapons systems crucial to national security. When coupled with the growing sophistication of counterfeits and physical malware, the need for advanced detection technology is apparent. Conventional screening technologies have proven incapable of robust and reliable counterfeit detection. Sophisticated counterfeits, such as cloned ICs and devices with hardware Trojans, would go undetected by conventional screening methods. Nokomis developed the Advanced Detection of Electronic Counterfeits (ADEC) technology to address this threat. ADEC has been demonstrated to detect aged (recycled), mismarked, and maliciously modified counterfeits. Previous efforts by Nokomis have demonstrated that active Radio Frequency (RF) illumination, causes electronics to reradiate rich characteristic emission signatures. RF illumination enables rapid and agile testing of a broader set of electronic components without the need for the dedicated test fixture currently used by ADEC. Combining RF illumination with the proven counterfeit detection capabilities of ADEC will provide a disruptive technology that will enable reliable capture of counterfeit and maliciously altered devices. Under this effort, Nokomis will develop and test a prototype enhanced ADEC system with integrated active RF illumination for rapid and agile detection of counterfeit electronics.

* Information listed above is at the time of submission. *

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