Automated Generation of Advanced Test Diagrams to Reduce Test Program Set Life-Cycle Costs

Award Information
Agency:
Department of Defense
Amount:
$145,309.00
Program:
SBIR
Contract:
N68335-10-C-0295
Solitcitation Year:
2010
Solicitation Number:
2010.1
Branch:
Navy
Award Year:
2010
Phase:
Phase I
Agency Tracking Number:
N101-029-2230
Solicitation Topic Code:
N101-029
Small Business Information
Summit Test Solutions
4266 Linda Vista Dr., Fallbrook, CA, 92028
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
833074904
Principal Investigator
 Ronald Taylor
 Chief Technologist
 (760) 310-5916
 ron.taylor@summittests.com
Business Contact
 Ronald Taylor
Title: Chief Technologist
Phone: (760) 310-5916
Email: ron.taylor@summittests.com
Research Institution
N/A
Abstract
The objective of this proposal and the proposed research project is to investigate the feasibility of developing a process and associated tools to generate wiring test diagrams automatically using data compliant with the Institute of Electrical and Electronics Engineers (IEEE) Automatic Test Markup Language (ATML) family of standards. Test diagrams show the routing of signals for each test in an automatic test program which tests a Unit Under Test (UUT) from an avionics system or other weapon system on an Automatic Test Equipment (ATE). The test diagrams provide the complete routing of signals from test station instruments to UUT and are a key support document, useful throughout the life cycle of the Test Program Set (TPS). Automated processes for test diagram generation promise to decrease the lengthy time to generate them by eliminating many hours of analysis of test stations, test programs and associated interface hardware. The proposed solution should also enhance the update process and eliminate errors and inconsistencies typical of manually generated diagrams. Relying on the ATML standards for the format of data in this process is a key component of this proposal and will provide a much desired open systems approach.

* information listed above is at the time of submission.

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