Onboard PCB Detection using a Portable Raman Analyzer

Award Information
Agency:
Department of Defense
Branch
Navy
Amount:
$70,000.00
Award Year:
2004
Program:
SBIR
Phase:
Phase I
Contract:
N65538-04-M-0129
Agency Tracking Number:
N041-100-0459
Solicitation Year:
2004
Solicitation Topic Code:
N04-100
Solicitation Number:
2004.1
Small Business Information
EIC LABORATORIES, INC.
111 Downey Street, Norwood, MA, 02062
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
076603836
Principal Investigator:
Kevin Spencer
Director, Spectroscopy Di
(781) 769-9450
spencer@eiclabs.com
Business Contact:
R. Rauh
President
(781) 769-9450
drauh@eiclabs.com
Research Institution:
n/a
Abstract
Contractors dismantling ships must ensure personnel are not at risk and no regulated material release occurs. The contractor is unlikely to have preexisting knowledge of toxins; therefore continuous materials analysis is part of the dismantling operation. For example, polychlorinated biphenyl (PCB) was used routinely in ship components ranging from gaskets to paints to power cords. Highly regulated by the EPA today, PCB must be identified and quantified. There is no EPA-approved field method for PCB detection; the resulting laboratory analysis is costly and slows down dismantling. We propose to develop a portable PCB analyzer based upon resonance Raman spectroscopy. Raman spectroscopy allows rapid and unique identification of the desired analyte; resonance enhancement allows low ppm detection. By overlapping the laser with a PCB absorption band, PCB can be selectively enhanced over any complex matrix. Using a compact portable UV echelle spectrograph, fiber optic coupling and a compact UV laser, we will develop a portable unit capable of rapid (<120 s) quantitative PCB identification. We will determine detection limits, reproducibility, calibration accuracy, and absence of potential matrix effects. The system will be turnkey, automated and used in military and commercial applications needed to meet EPA PCB regulations.

* information listed above is at the time of submission.

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