Electronic Correlated Noise Calibration Standard for Interferometric and Polarimetric Microwave Radiometers

Award Information
Agency:
National Aeronautics and Space Administration
Branch
n/a
Amount:
$69,993.00
Award Year:
2004
Program:
SBIR
Phase:
Phase I
Contract:
NNG04CA44C
Agency Tracking Number:
035365
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
EMAG Technologies, Inc.
1340 Eisenhower Place, Ann Arbor, MI, 48108
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
836493759
Principal Investigator:
Kazem Sabet
Principal Investigator
(734) 973-6600
ksabet@emagtech.com
Business Contact:
Kazem Sabet
President
(734) 973-6600
ksabet@emagtech.com
Research Institution:
n/a
Abstract
A new type of calibration standard is proposed which produces a pair of microwave noise signals to aid in the characterization and calibration of correlating radiometers. The Correlated Noise Calibration Standard (CNCS) is able to generate pairs of broad bandwidth stochastic noise signals with a wide variety of statistical properties. The CNCS can be used with synthetic aperture interferometers to generate specific visibility functions. It can be used with fully polarimetric radiometers to generate specific 3rd and 4th Stokes parameters of brightness temperature. It can be used with spectrometers to generate specific power spectra and autocorrelations. It is also possible to combine these features and, for example, to generate the pair of signals that would be measured by a fully polarimetric, spectrally resolving, synthetic aperture radiometer at a particular pair of polarizations and antenna baselines for a specified scene over a specified frequency band. The CNCS covers those frequencies used for radiometric observations in the 1 to 40 GHz range. While intended for ground based characterization of radiometer systems, the technological approach is amenable to on-orbit calibration. Also, the CNCS can serve as an artificial radio frequency interference (RFI) generator for validating instrument performance in the presence of RFI.

* information listed above is at the time of submission.

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