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Full Mueller Matrix Characterization of Imaged Samples using Digital Holography

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA9451-18-P-0260
Agency Tracking Number: F18A-007-0057
Amount: $149,946.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: AF18A-T007
Solicitation Number: 2018.0
Solicitation Year: 2018
Award Year: 2018
Award Start Date (Proposal Award Date): 2018-08-07
Award End Date (Contract End Date): 2019-05-07
Small Business Information
PO Box 9334
Albuquerque, NM 87119
United States
DUNS: 176086952
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Louis Cuellar
 (505) 244-1222
Business Contact
 J. Kelly
Phone: (505) 244-1222
Research Institution
 University of New Mexico
 Dr. Sudhakar Prasad
1700 Lomas Blvd NE, Albuquerque, NM 87106 Ste 100N
Albuquerque, NM 87106
United States

 (505) 277-5876
 Nonprofit College or University

The Department of Defense relies on a worldwide network of radar and optical sites to maintain Space Situational Awareness.Although careful consideration during site selection process solves some of this mission's challenges, optical sensor imaging of objects at significant ranges is always hampered by many other factors, such as limited-aperture optics and atmospheric turbulence.There remains, however, a largely untapped wealth of information in the objects optical signature, in the form of the shape and material effects on the polarization of the reflected illumination light.These polarimetric effects can be described as diattenuation, retardance, and depolarization.These three characteristics for a given material can be fully expressed with a 4x4 element matrix known as the Mueller matrix.Previous polarimetric systems required tedious and time-consuming measurements to compute the Mueller matrix of materials over a large spectral and scattering angle range. Tau Technologies has developed an innovative approach based on digital holography to obtain the polarimetric measurements to accurately and rapidly determine the Mueller matrix.This novel approach can be used to create a detailed parametric Mueller matrix database which can be employed to precisely identify materials and their orientation on an unknown object that has been polarimetrically imaged at range.

* Information listed above is at the time of submission. *

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