APPLICATION OF THE SCANNING TUNNELING MICROSCOPE FOR NON-CONTACT TESTING OF HGCDTE DIODES

Award Information
Agency: Department of Defense
Branch: Army
Contract: N/A
Agency Tracking Number: 5848
Amount: $617,405.00
Phase: Phase II
Program: SBIR
Awards Year: 1989
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
510-a Herndon Pkwy, Herndon, VA, 22070
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Dr Horacio Verdun
 (703) 471-7671
Business Contact
Phone: () -
Research Institution
N/A
Abstract
A NOVEL METHOD FOR NON-CONTACT, NON-INVASIVE IN-SITU PHOTODIODE EVALUATION ON THE WAFER IS PROPOSED. THE PROPOSED METHOD IS BASED ON A MODIFIED FORM OF THE SCANNING TUNNELING MICROSCOPE (STM). ALTHOUGH PRIMARILY A TOOL FOR MATERIALS SURFACE RESEARCH, WE BELIEVE THE TECHNIQUE CAN BE ADAPTED TO MEASURE CURRENT THROUGH THE DIODE VIA TUNNELING FROM THE PROBE TIP TO THE CONTACTIVE PADS OF THE DIODES. IN CONJUNCTION WITH AN OPTICAL PROBE BEAM, THE RESPONSIVITY AT DIFFERENT WAVELENGTH AS WELL AS THE I-V CHARACTERISTIC CAN BE MEASURED.

* Information listed above is at the time of submission. *

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