An Ultrahigh Resolution Specimen Holder with Large Tilt Range for the Transmission Electron Microscope

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-FG02-05ER84235
Agency Tracking Number: 78128S05-I
Amount: $750,000.00
Phase: Phase II
Program: SBIR
Awards Year: 2006
Solicitation Year: 2006
Solicitation Topic Code: 23
Solicitation Number: DE-FG02-06ER06-09
Small Business Information
5286 Lakehills Street SE, Lacey, WA, 98513
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Mark Scheeff
 (360) 252-2737
Business Contact
 Norman Salmon
Title: Mr.
Phone: (360) 252-2737
Email: See comments
Research Institution
Transmission electron microscopy (TEM) is the primary methodology for characterizing the internal structure of materials at the nanometer to sub-Angstrom scale. In the TEM, image formation results from the scattering of an incident electron wave by the atoms inside the crystal, and results in the formation of an image via either amplitude or phase contrast. In each case, the details of the scattering processes are highly dependent on the precise angle between the incident beam and the sample. However, the currently available mechanisms for in situ sample tilting is limited in resolution and accuracy by the frictional interfaces in the mechanism and the presence of large amounts of backlash. These mechanisms also have limited goniometer tilt range because of the width and thickness of the mechanism. This project will develop a specimen holder that will provide microscopists with unprecedented access to the crystallographic planes of their specimen, making it easy to achieve precise orientations. In Phase I, we developed and tested new hardware that provided both high resolution and high range in pole pieces suitable for materials science work. In Phase II, we will refine and extensively test this design, as well as improve the interface to the microscope. Commercial Applications and other Benefits as described by the awardee: By providing high resolution, range, and stability, the new specimen holder should allow researchers in nanotechnology and materials science to fully exploit recent gains in resolution in advanced electron microscopes. The images produced by these microscopes are used routinely to guide discoveries in nanoscience and materials development, and form a critical component in the semiconductor failure analysis market.

* Information listed above is at the time of submission. *

Agency Micro-sites

SBA logo
Department of Agriculture logo
Department of Commerce logo
Department of Defense logo
Department of Education logo
Department of Energy logo
Department of Health and Human Services logo
Department of Homeland Security logo
Department of Transportation logo
Environmental Protection Agency logo
National Aeronautics and Space Administration logo
National Science Foundation logo
US Flag An Official Website of the United States Government