You are here

Benchtop Instrument for Measuring High Temperature Surface Emissivity (CRP)

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA9101-19-C-0045
Agency Tracking Number: F2-0029
Amount: $999,945.00
Phase: Phase II
Program: SBIR
Solicitation Topic Code: AF99-022
Solicitation Number: 99.1
Timeline
Solicitation Year: 1999
Award Year: 2019
Award Start Date (Proposal Award Date): 2019-04-16
Award End Date (Contract End Date): 2021-04-16
Small Business Information
87 Church Street
East Hartford, CT 06108
United States
DUNS: 021804661
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 James R Markham
 Chief Executive Officer
 (860) 528-9806
 jim@AFRinc.com
Business Contact
 Karin Dutton
Phone: (860) 528-9806
Email: karin@afrinc.com
Research Institution
N/A
Abstract

The testing of the high temperature materials at AEDC requires measurement of surface temperature. Infrared cameras are used for non-contact, spatial measurements, but for accurate temperature the infrared emittance of the material must be known at comparable temperature, view angle, and camera spectral range. The Phase I and II projects demonstrated that many problems of measuring emittance with a benchtop instrument could be overcome with a novel methodology using both spectral radiance and reflection/transmittance measurements. Phase II delivered a unique high temperature spectral emissometer to the Aero-Thermal Material Laboratory at AEDC. The instrument has worked well for many years but is presently limited in capability for present day applications for hypersonic flight systems and vehicles undergoing testing at AEDC. Capability for higher temperatures and multiple angles is presently required. This CRP will incorporate state-of-the-art components and improve automation, measurement speed and user-friendliness. To meet present day applications, the enhanced spectral emissometer will provide measurements at four take-off angles of 1524°, 30°, 45° and 60°, and it will provide for measurements at sample temperatures from room temperature to above 3000°R with 5000°R as the stretch goal. It will meet the infrared wavelength range requirement of 0.8 to 20 microns.

* Information listed above is at the time of submission. *

US Flag An Official Website of the United States Government