RESOLUTION ELECTRON MICROSCOPY) MICROANALYSIS - INNOVATIVE METHODS

Award Information
Agency:
Department of Defense
Amount:
$80,000.00
Program:
SBIR
Contract:
N/A
Solitcitation Year:
N/A
Solicitation Number:
N/A
Branch:
Air Force
Award Year:
1985
Phase:
Phase I
Agency Tracking Number:
2101
Solicitation Topic Code:
N/A
Small Business Information
Ii-vi Inc
Saxonburg Blvd, Saxonburg, PA, 16056
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
N/A
Principal Investigator
 DAVID G RYDING
 (412) 352-4455
Business Contact
Phone: () -
Research Institution
N/A
Abstract
THIN LAYER SEMICONDUCTING DEVICES HAVE LARGE POTENTIAL IN BOTH DEFENSE AND COMMERICAL APPLICATIONS. STRUCTURES BUILT IN THE HGCDTE/ CDTE, ALGAAS AND INGAASP/INP SYSTEMS ARE IN NEED OF INTENSIVE MATERIALS INVESTIGATION. TRANSMISSION ELECTRON MICROSCOPY (TEM) AND ITS RELATED TECHNIQUES ARE POWERFUL TOOLS TO REVEAL CRITICAL INTERFACE CHARACTERISTICS, IMPURITY CONCENTRATIONS AND DISTRIBUTIONS, AND VARIOUS LATTICE DEFECTS. THE PRIMARY OBJECTIVE OF PHASE I IS TO INVESTIGATE NEW AND INNOVATIVE METHODS OF PREPARING ELECTRON TRANSPARENT CROSS-SECTIONS IN EPITAXIALLY LAYERED, RELATIVELY DELICATE HGCDTE, ALGAAS AND INGAASP STRUCTURES. WE WILL THEN SURVEY CAREFULLY PREPARED SAMPLES WITH PARTICULAR FOCUS ON REVEALING DIFFICULT TO LOCATE INTERFACE FEATURES. PHASE I WILL INCLUDE: 1. INVESTIGATION OF EPOXY SANDWICH TECHNIQUES. 2. INVESTIGATION OF SOLDER BASED TECHNIQUES. 3. CRITICAL SELECTION OF BEST TECHNIQUE. 4. DEVELOPMENT OF TECHNIQUE AND APPARATUS. 5. APPLICATION OF TECHNIQUE TO LPE, MBE AND MOCVD SAMPLES AND TEM SURVEY OF FEATURES.

* information listed above is at the time of submission.

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