IMPROVED GROWTH OF CRYSTALS FOR INFRARED DETECTORS

Award Information
Agency:
National Science Foundation
Branch
n/a
Amount:
$50,000.00
Award Year:
1988
Program:
SBIR
Phase:
Phase I
Contract:
n/a
Agency Tracking Number:
7516
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
Ii-vi Inc
Saxonburg Boulevard, Saxonburg, PA, 16056
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
DONALD R NICHOLS
() -
Business Contact:
() -
Research Institution:
n/a
Abstract
CDTESE HAS RECENTLY BEEN SHOWN TO HAVE EPD (ETCH PIT DENSITY) LEVELS IN THE MID-10(4)/CM(2) RANGE, AND DUE TO THEDISTRIBUTION COEFFICIENT OF SE (1.03) IN CDTE, LARGE CRYSTALS WITH UNIFORM COMPOSITIONS AND LATTICE CONSTANTS HAVE BEEN PRODUCED BY THE VERTICAL BRIDGMAN (VB) METHOD. THESE FEATURES MAKE CDTESE SUBSTRATES AN ATTRACTIVE CHOICE FOR IMPROVED LARGE AREA, LATTICE MATCHED HGCDTE EPITAXY. LOW STRESS HORIZONTAL BRIDGMAN (HB) GROWTH PROCESSING WILL BE UTILIZED TO GROW HIGH PURITY CDTESE SINGLE CRYSTALS. THEPROCESS WILL BE TAILORED TO ELIMINATE EPD VLUSTERING AND DRIVE EPD LEVELS INTO THE 10(3)/CM(2) RANGE. GROWTH CYCLE IMPURITY CONTAMINATION, ESPECIALLY FROM CANDIDATE LOW STRESSCONTAINER MATERIALS, WILL BE INVESTIGATED. THE FEASIBILITY OF LOW STRESS HB GROWN CDTESE WILL BE INVESTIGATED. PRINCIPAL AREAS OF INTEREST WILL BE: A) UNCLUSTERED EPD LEVELS IN THE LOW 10(3)/CM(2) RANGE, B) UNIFORM SE DISTRIBUTION, THEREFORE CONSTANT LATTICE PARAMETER, C) NARROW (15 ARCSEC) X-RAY ROCKING CURVES AND MACROSCOPICALLY UNIFORM X-RAY TOPOGRAPHS OVER USEFUL SUBSTRATE AREAS, D) RETAINED HIGH PURITY OF STARTING MATERIALS, AND E) UNDERSTANDING OF PROCESS SCALABILITY TO ACHIEVE 3 X 4 CM OR LARGER SIZES.

* information listed above is at the time of submission.

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