Scanning Probe Microscopy

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-FG02-09ER85258
Agency Tracking Number: 90065
Amount: $94,338.00
Phase: Phase I
Program: SBIR
Awards Year: 2009
Solicitation Year: 2008
Solicitation Topic Code: 05 b
Solicitation Number: DE-PS02-08ER08-34
Small Business Information
Advanced Research Corporation
4459 White Bear Parkway, White Bear Lake, MN, 55110
DUNS: 156974024
HUBZone Owned: Y
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Vernon Cottles
 Dr.
 (651) 789-9000
 vcottles@arcnano.com
Business Contact
 Greg Wagner
Title: Mr.
Phone: (651) 789-9000
Email: gwagner@arcnano.com
Research Institution
N/A
Abstract
The DOE¿s interest in the fundamental research and development of advanced materials, devices, and structures necessitates associated research into advanced characterization metrology. Such characterization needs are particularly evident in regimes operating at nanometer scales. This project is concerned with one aspect of this very broad metrology field: the measurement of high frequency magnetic fields at the nanometer scale. One technique for performing calibrated field measurements on the nanometer scale is Scanning Hall Probe Microscopy (SHPM). Another technique for characterizing magnetic fields and structures on this scale is Magnetic Force Microscopy (MFM), which is based on the Atomic Force Microscope (AFM). Although MFM provides high imaging resolution, existing probes do not provide a quantified measurement of the magnetic field strength. On the other hand, SHPM provides a quantified field measurement, but does not have MFM¿s spatial resolution. Therefore, this project will develop a metrology that combines the intrinsic spatial resolution of MFM with the intrinsic quantification capability of SHPM. Such a device would greatly enhance both the spatial accuracy of the magnetic field measurement as well as the type of sample that can be characterized, thus achieving a measurement capability that does not currently exist.

* information listed above is at the time of submission.

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