NanoTEM

Company Information
Address 7702 E. Doubletree Ranch Rd.
Ste. 300
Scottsdale, AZ, 85258-

http://www.nanotem.com

Information

DUNS: 868448846

# of Employees: 5


Ownership Information

Hubzone Owned: N

Socially and Economically Disadvantaged: N

Woman Owned: N



Award Charts




Award Listing

  1. Electronic Component Fingerprinting to Determine Manufacturing Origin

    Amount: $999,014.00

    In the area of supply chain integrity improvement, the US defense and intelligence sectors anticipate multiple uses for the forensic capability to characterize an electronic component for the purpose ...

    SBIRPhase II2014Department of Defense Defense Advanced Research Projects Agency
  2. A Rapid and Cost-Effective Approach to Nanostructural Analysis of Semiconductor Devices

    Amount: $736,328.00

    An expedited and economical nanostructural sampling and analysis of semiconductor devices will be crucial to accelerated product development and rapid introduction of these technologies to the market ...

    SBIRPhase II2010Department of Defense Air Force
  3. VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

    Amount: $983,746.00

    The state-of-the-art FPA manufacturing technologies commonly generate some critical defects in the pixel elements, which adversely impact their operability and reliability. In Phase I, the feasibilit ...

    SBIRPhase II2010Missile Defense Agency Department of Defense
  4. VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

    Amount: $99,998.00

    This Phase I proposal seeks to demonstrate the feasibility of characterizing the depletion region of a VLWIR HgCdTe photodiode in plan-view and in nano-scale to detect and study the structural anomali ...

    SBIRPhase I2009Missile Defense Agency Department of Defense
  5. A Rapid and Cost-Effective Approach to Nanostructural Analysis of Semiconductor Devices

    Amount: $99,997.00

    Phase I proposal focuses on the demonstration of the feasibility to improve the efficiency and to lower the cost associated with nanostructural analysis of semiconductor devices by implementing a two- ...

    SBIRPhase I2009Air Force Department of Defense

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