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TOTAL DOSE PROM TEST
Phone: (703) 893-2111
THE MAIN OBJECTIVE OF THIS PROJECT IS TO CHARACTERIZE UP TO 5 EPROM IC PART TYPES TO TOTAL IONIZING DOSE. UNHARDENED EPROMS AND UVEPROMS WITH HIGH MEMORY DENSITIES, MOS TECHNOLOGIES, AND SCALED DOWN GEOMETRICS WILL BE CONSIDERED. ONLY THOSE EPROMS PRODUCED BY U.S. MANUFACTURERS AND FOR WHICH THERE IS NO EXISTING TOTAL DOSE DATA WILL BE TESTED. EACH DEVICE WILL BE POWERED UP AND FUNCTIONALLY TESTED CONTINUOUSLY WHILE BEING IRRADIATED IN ONE OF IRT'S COBALT-60 SOURCES. (A SPECIAL TEST CIRCUIT WILL BE DEVELOPED FOR THIS APPLICATION.) AS A RESULT, ERRORS DUE TO ANNEALING WILL BE MINIMIZED AND MORE ACCURATE FAILURE LEVELS CAN BE ACHIEVED THAN WITH STEP TESTING. THE TOTAL DOSE FAILURE LEVELS, PREAND POST-IRRADIATION PARAMETERS, AS WELL AS OTHER PERTINENT DATA WILL BE RECORDED, ANALYZED, AND REPORTED.
* Information listed above is at the time of submission. *