Terahertz Ellipsometry for Reflection-Mode Material Characterization

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$99,993.00
Award Year:
2008
Program:
STTR
Phase:
Phase I
Contract:
W911NF-08-C-0111
Award Id:
85037
Agency Tracking Number:
A08A-013-0042
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
645 M Street, Suite 102, Lincoln, NE, 68508
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
175330976
Principal Investigator:
CraigHerzinger
Research Scientist
(402) 477-7501
cherzinger@jawoollam.com
Business Contact:
MargeKnight
Controller
(402) 477-7501
mknight@jawoollam.com
Research Institute:
UNIV. OF NEBRASKA-LINCOLN
Suzan G Lund
312 N. 14th St
Alexander West
Lincoln, NE, 68588
(402) 472-1930
Nonprofit college or university
Abstract
As technologies utilizing THz radiation (light) are developed, the optical properties for many materials need to be determined accurately as a function of frequency. In a security screening system, measured optical properties might be used to distinguish, independent of shape, between threat and background materials. Improved optical elements for increasingly advanced THz systems will require optical constants and instrumentation for design and quality control. Measured THz optical properties are intrinsically connected to underlying low-energy physical processes and thereby allow testing of existing scientific theories and exploration of novel developments such as artificially structured meta-materials. Ellipsometry is the preeminent technique for accurate, quantitative determination of complex-valued optical constants and for non-destructively characterizing layered structures. The J. A. Woollam Co. proposes developing a variable-angle spectroscopic ellipsometer for operation at terahertz (THz) frequencies as an addition to the company's existing line of ellipsometers, which span frequencies from the infrared (IR-VASEr, 10 to 150 THz) to the vacuum ultraviolet (VASEr 150 to 2000 THz). Work by Drs. Mathias Schubert and Tino Hofmann at the University of Nebraska-Lincoln (UNL) in far-infrared and THz ellipsometry using frequency-domain techniques shows promise. In collaboration with UNL, phase I would evaluate potential system components (sources, detector, polarization-state control optics) for use in a commercial THz ellipsometer.

* information listed above is at the time of submission.

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