Reliable MWM-Array Inspection and Condition Assessment for IBRs

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$99,993.00
Award Year:
2007
Program:
SBIR
Phase:
Phase I
Contract:
FA8650-07-M-2774
Agency Tracking Number:
F071-176-1702
Solicitation Year:
2007
Solicitation Topic Code:
AF071-176
Solicitation Number:
2007.1
Small Business Information
JENTEK SENSORS, INC.
110-1 Clematis Avenue, Waltham, MA, 02453
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
018791827
Principal Investigator:
Mark Windoloski
Principal Investigator
(781) 642-9666
jentek@shore.net
Business Contact:
Joni Hatem
Sr. Vice President
(781) 642-9666
jhatem@primushost.com
Research Institution:
n/a
Abstract
JENTEK’s conformable MWM-Array eddy current sensors are proven and uniquely suited for automated inspection of Integrally Bladed Rotors (IBRs). Recent implementations for U.S. Navy disk slot and blade dovetail inspections have clearly demonstrated the MWM-Array versatility. Over 3000 engine disk slots have been inspected at one Naval Air Station with cracks detected and verified (by fractography or other means) on nine of these disks, with no false indications. Most of these cracks, in shot peened regions with fretting damage, were missed by conventional eddy current testing (ET) and liquid penetrant inspection (LPI). This Phase I SBIR will adapt this proven technology to deliver a near term solution for IBR inspection. Furthermore, the Phase I will investigate the use of time sequenced, high resolution MWM-Array images of complex IBR surfaces (e.g., leading edges, airfoils, double curvatures) with novel space-time filtering methods, to provide earlier damage detection capability, residual stress relaxation imaging, and foreign object damage (FOD) repair assessment. MTU Aero Engines North America, a manufacturer of IBRs for several U.S. military and commercial engines, will provide access to available components and engineering guidance. Delivery of practical near term capabilities, as well as development of fundamental advances in inspection technology, is addressed.

* information listed above is at the time of submission.

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