Reliable MWM-Array Inspection and Condition Assessment for IBRs

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8650-07-M-2774
Agency Tracking Number: F071-176-1702
Amount: $99,993.00
Phase: Phase I
Program: SBIR
Awards Year: 2007
Solicitation Year: 2007
Solicitation Topic Code: AF071-176
Solicitation Number: 2007.1
Small Business Information
JENTEK SENSORS, INC.
110-1 Clematis Avenue, Waltham, MA, 02453
DUNS: 018791827
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Mark Windoloski
 Principal Investigator
 (781) 642-9666
 jentek@shore.net
Business Contact
 Joni Hatem
Title: Sr. Vice President
Phone: (781) 642-9666
Email: jhatem@primushost.com
Research Institution
N/A
Abstract
JENTEK’s conformable MWM-Array eddy current sensors are proven and uniquely suited for automated inspection of Integrally Bladed Rotors (IBRs). Recent implementations for U.S. Navy disk slot and blade dovetail inspections have clearly demonstrated the MWM-Array versatility. Over 3000 engine disk slots have been inspected at one Naval Air Station with cracks detected and verified (by fractography or other means) on nine of these disks, with no false indications. Most of these cracks, in shot peened regions with fretting damage, were missed by conventional eddy current testing (ET) and liquid penetrant inspection (LPI). This Phase I SBIR will adapt this proven technology to deliver a near term solution for IBR inspection. Furthermore, the Phase I will investigate the use of time sequenced, high resolution MWM-Array images of complex IBR surfaces (e.g., leading edges, airfoils, double curvatures) with novel space-time filtering methods, to provide earlier damage detection capability, residual stress relaxation imaging, and foreign object damage (FOD) repair assessment. MTU Aero Engines North America, a manufacturer of IBRs for several U.S. military and commercial engines, will provide access to available components and engineering guidance. Delivery of practical near term capabilities, as well as development of fundamental advances in inspection technology, is addressed.

* information listed above is at the time of submission.

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