Reflex Triode Design Optimization

Award Information
Agency: Department of Defense
Branch: Defense Threat Reduction Agency
Contract: DTRA01-01-P-0165
Agency Tracking Number: T011-0035
Amount: $99,985.00
Phase: Phase I
Program: SBIR
Awards Year: 2001
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
2201 Buena Vista SE, Suite 400, Albuquerque, NM, 87106
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Frank Davies
 Applied Physics/Test Mgr.
 (505) 998-5830
Business Contact
 David Stratmoen
Title: Contracts Manager
Phone: (505) 998-5830
Research Institution
Survivable shields are a necessary part of many soft x-ray debris mitigation systems that provide ultra clean test environments for nuclear weapons effects testing. Existing test requirements demand ultra large area survivable shields (12 inch diameter).Existing designs are limited to relatively small areas at low fluences and/or impose severe x-ray attenuation penalties. A methodology for the design of ultra large survivable shields is proposed. The Ktech technical approach to optimizing the design ofan ultra survivable shield is to optimally minimize and accommodate the shield response to each of the loads imposed on the shield by the PRS radiation and debris environments through geometric configuration and material selection with the constraint oflow soft x-ray (K line) attenuation. The loads on a survivable shield are a combination of UV induced blow off, pressure loads exerted by expanding plasmas from the PRS source region and from UV filters, particulate debris impacts and radiation inducedline loads and moments. Techniques to eliminate or minimize to the extent possible each of these loads are presented.Survivable shield/window technology is required for nearly all of the test facilities examining the response and survivability of stockpile components/systems to hostile (man made or natural) environments. Large area survivable shields are required for all PRS simulations, for many electron and ion beam tests and for NIF. Survivable window technology is also a critical element in thedesign of ion or electron beam pulsers for surface hardening of materials, waste remediation, semi-conductor fabrication and for medical applications.

* information listed above is at the time of submission.

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