ELECTRO-OPTIC PROBES FOR ON-WAFER TESTING OF GAAS MMICS

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: N/A
Agency Tracking Number: 6069
Amount: $49,974.00
Phase: Phase I
Program: SBIR
Awards Year: 1987
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
897-5a Independence Ave, Mountain View, CA, 94043
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 DR RICHARD W WALLACE
 (415) 962-0755
Business Contact
Phone: () -
Research Institution
N/A
Abstract
IN THE PROPOSED RESEARCH, LIGHTWAVE ELECTRONICS WILL INVESTIGATE MAKING SEPARATE OFF-SUBSTRATE MICROPROBES FOR GALLIUM ARSENIDE (GAAS) MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS) BASED UPON THE ELECTRO-OPTIC SAMPLING TECHNIQUE. THESE PROBES WILL BE OF A SUFFICIENTLY SMALL SIZE SO THAT WHEN THEY ARE PLACED NEXT TO OR IN CONTACT WITH THE CIRCUIT OR DEVICE TO BE TESTED THEY WOULD NOT LOAD OR PERTURB IT. THIS TECHNIQUE MEASURES BOTH THE MAGNITUDE AND PHASE OF VOLTAGE WAVEFORMS AT PRECISE POINTS WITHIN THE MMICS, BUT IT DOES NOT REQUIRE POLISHED SURFACES OR A CLEAR OPTICAL PATH INTO THE DEVICE SUBSTRATE AT THE MEASUREMENT POINT AS IS THE CASE WHEN PROBING DIRECTLY IN THE SEMICONDUCTOR SUBSTRATE.

* Information listed above is at the time of submission. *

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