You are here
HIGH EFFICIENCY COMPACT MODELING OF RADIATION EFFECTS
Title: VP Research & App. Consul
Phone: (479) 575-9222
Phone: (503) 241-7195
The objective of this research is to develop beta versions of tools for automatically migrating radiation effects predicted in TCAD level tools to compact modeling tools. This transition will enable compact models that possess radiation effects to be quickly generated, which can then be used in circuit design activity. This approach is a substantial improvement over the current ad hoc approaches. Lynguent will develop and demonstrate model-based design tools for systematically supporting the rapid deployment of radiation-enhanced compact models including the vital step of model validation. The intent is for these modeling and verification tools to be “added-on” as third party tools to existing commercial simulators, TCAD tools, and design environments promoting their rapid adoption and widespread use. The desire is to provide a standardized approach for modeling and collaborative design independent of the underlying design environment. Phase II will focus on radiation effects in 90 nm technology. We will investigate the prevalent radiation effects at this process node, modify a TCAD model to predict the effects on the device, and then demonstrate how these effects can be transitioned to compact models.
* Information listed above is at the time of submission. *