Integration of Signal Analysis Suite and Field-Portable Matrix Laser Doppler Vibrometer (MXLDV) for Composite NDE

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8501-08-M-0025
Agency Tracking Number: F073-117-0025
Amount: $99,936.00
Phase: Phase I
Program: SBIR
Awards Year: 2008
Solicitation Year: 2007
Solicitation Topic Code: AF073-117
Solicitation Number: 2007.3
Small Business Information
METROLASER, INC.
2572 White Road, Irvine, CA, 92614
DUNS: 188465819
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 James Kilpatrick
 Senior Scientist
 (949) 553-0688
 jkilpatrick@metrolaserinc.com
Business Contact
 Cecil Hess
Title: President
Phone: (949) 553-0688
Email: cecilh@metrolaserinc.com
Research Institution
N/A
Abstract
This proposal seeks to produce a unique instrument for flight-line NDE and defect detection in aerospace composite structures based on integration of a new high speed laser Doppler imaging vibrometer with an automated software data processing suite. The principle of the method and technical feasibility of the proposed instrument has already been established with solutions to the major technical hurdles having been demonstrated. This proposal lays out a path to practical implementation of a field instrument employing a customized detector/processor unit running dedicated data processing and defect image extraction algorithms developed under this program. The Matrix Laser Doppler Vibrometer (MXLDV) employs a 2D fiber-optic LDV array which enables high speed image capture of any arbitrary surface vibration distribution including steady state (modal), random or transient vibrations. This feature of the MXLDV is unparalleled by existing optical methods such as scanning laser Doppler vibrometry (SLDV), electronic speckle pattern interferometry (ESPI) or shearography, which have all been proposed and investigated for this application. As a unique technology, MXLDV offers the prospect of a practical field instrument for composite NDE and defect detection which is many times faster than SLDV and many times more sensitive than ESPI or shearography.

* information listed above is at the time of submission.

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