SEE Modeling and Mitigation in Ultra-Deep Submicron Microelectronics

Award Information
Agency:
Department of Defense
Branch
Defense Threat Reduction Agency
Amount:
$100,000.00
Award Year:
2007
Program:
SBIR
Phase:
Phase I
Contract:
HDTRA1-07-P-0231
Award Id:
83201
Agency Tracking Number:
T071-005-0031
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
4775 Centennial Avenue, Suite 130, Colorado Springs, CO, 80919
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
619085371
Principal Investigator:
David Mavis
Chief Scientist
(505) 507-0542
david.mavis@micro-rdc.com
Business Contact:
Mary Dyson
Director Business Operations
(505) 294-1962
mary.dyson@micro-rdc.com
Research Institution:
n/a
Abstract
As technology feature sizes decrease, single event upset (SEU), digital single event transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of microcircuits. Recent test circuits and test methods have quantified the pulse widths of DSETs generated from heavy-ion strikes on critical microcircuit nodes. These pulse widths have proven to be much larger than previously thought, which substantiates the importance of DSET induced errors to the soft error rate (SER) of modern microcircuits. We apply new circuit SEE modeling approaches which couple the circuit response to the charge collection mechanisms. Our approach uses standard SPICE circuit elements, is easily calibrated, and runs as fast as conventional current injection simulations. This enables efficient and cost effective SEE simulation of advanced microcircuits. New mitigation approaches are proposed to improve the heavy-ion response of ultra-deep submicron integrated circuits. These approaches are minimally invasive to existing fabrication processes and can be transparently applied to existing bulk CMOS microcircuit layouts. The proposed methods include process modifications, design hardening techniques, and substrate engineering approaches.

* information listed above is at the time of submission.

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