EVALUATION OF SYSTEM DESIGN TECHNIQUES TO INCREASE EFFECTIVE MICROCIRCUIT HARDNESS

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$99,198.00
Award Year:
1987
Program:
SBIR
Phase:
Phase I
Contract:
n/a
Award Id:
6144
Agency Tracking Number:
6144
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
5434 Ruffin Rd, San Diego, CA, 92119
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
JAMES P RAYMOND
(619) 560-5351
Business Contact:
() -
Research Institution:
n/a
Abstract
THE RADIATION HARDNESS OF SEMICONDUCTOR DEVICES IS A FUNCTIONAL OF ELECTRICAL BIAS DURING EXPOSURE, CHIP TEMPERATURE AND OPERATING REQUIREMENTS. THE PROPOSED PROGRAM WILL INVESTIGATE THE POTENTIAL USE OF THE MANAGEMENT OF ELECTRICAL AND ENVIRONMENTAL CONDITIONS IN A CIRCUMVENTED ELECTRONICS SUBSYSTEM TO INCREASE THE EFFECTIVE HARDNESS OF THE SEMICONDUCTOR PIECEPARTS. PARTICULAR EMPHASIS WILL BE DIRECTEDTO THE USE OF MIL-QUALIFIED STANDARD MICROCIRCUITS FOR USE IN SYSTEMS WITH SEVERE RADIATION EXPOSURE REQUIREMENTS. MICROCIRCUIT TECHNOLOGIES CONSIDERED WILL INCLUDE HIGH DENSITY CMOS AND OXIDE-SEPARATED BIPOLAR FOR DIGITAL AND ANALOG APPLICATIONS. RADIATION FAILURE MECHANISMS CONSIDERED WILL INCLUDE LONG-TERM IONIZATION PERMANENT DAMAGE AND LATCHUP INDUCED BY EITHER PULSED IONIZING RADIATION OR A SINGLE HIGH ENERGY PARTICLE. THE PROGRAM WILL USE ADVANCED REENTRY VEHICLE ELECTRONICS CURRENTLY IN PRELIMINARY DEVELOPMENT AS A BASELINE TO ASSESS THE PRACTICAL MERIT OF POSSIBLE HARDENING TECHNIQUES. IN ADDITION TO HARDENING AND PERFORMANCE REQUIREMENTS, CONSTRAINTS OF HARDNESS VALIDATION AND HARDNESS ASSURANCE WILL BE CONSIDERED.

* information listed above is at the time of submission.

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