EVALUATION OF SYSTEM DESIGN TECHNIQUES TO INCREASE EFFECTIVE MICROCIRCUIT HARDNESS

Award Information
Agency:
Department of Defense
Amount:
$99,198.00
Program:
SBIR
Contract:
N/A
Solitcitation Year:
N/A
Solicitation Number:
N/A
Branch:
Air Force
Award Year:
1987
Phase:
Phase I
Agency Tracking Number:
6144
Solicitation Topic Code:
N/A
Small Business Information
Mission Research Corp
5434 Ruffin Rd, San Diego, CA, 92119
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
N/A
Principal Investigator
 JAMES P RAYMOND
 (619) 560-5351
Business Contact
Phone: () -
Research Institution
N/A
Abstract
THE RADIATION HARDNESS OF SEMICONDUCTOR DEVICES IS A FUNCTIONAL OF ELECTRICAL BIAS DURING EXPOSURE, CHIP TEMPERATURE AND OPERATING REQUIREMENTS. THE PROPOSED PROGRAM WILL INVESTIGATE THE POTENTIAL USE OF THE MANAGEMENT OF ELECTRICAL AND ENVIRONMENTAL CONDITIONS IN A CIRCUMVENTED ELECTRONICS SUBSYSTEM TO INCREASE THE EFFECTIVE HARDNESS OF THE SEMICONDUCTOR PIECEPARTS. PARTICULAR EMPHASIS WILL BE DIRECTEDTO THE USE OF MIL-QUALIFIED STANDARD MICROCIRCUITS FOR USE IN SYSTEMS WITH SEVERE RADIATION EXPOSURE REQUIREMENTS. MICROCIRCUIT TECHNOLOGIES CONSIDERED WILL INCLUDE HIGH DENSITY CMOS AND OXIDE-SEPARATED BIPOLAR FOR DIGITAL AND ANALOG APPLICATIONS. RADIATION FAILURE MECHANISMS CONSIDERED WILL INCLUDE LONG-TERM IONIZATION PERMANENT DAMAGE AND LATCHUP INDUCED BY EITHER PULSED IONIZING RADIATION OR A SINGLE HIGH ENERGY PARTICLE. THE PROGRAM WILL USE ADVANCED REENTRY VEHICLE ELECTRONICS CURRENTLY IN PRELIMINARY DEVELOPMENT AS A BASELINE TO ASSESS THE PRACTICAL MERIT OF POSSIBLE HARDENING TECHNIQUES. IN ADDITION TO HARDENING AND PERFORMANCE REQUIREMENTS, CONSTRAINTS OF HARDNESS VALIDATION AND HARDNESS ASSURANCE WILL BE CONSIDERED.

* information listed above is at the time of submission.

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