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Design Methodology for Preventing SE Disruptions in Deep Submicron Microelectronics

Award Information
Agency: Department of Defense
Branch: Defense Threat Reduction Agency
Contract: DTRA01-01-C-0045
Agency Tracking Number: 99-P1-164
Amount: $750,000.00
Phase: Phase II
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Solicitation Year: N/A
Award Year: 2001
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
735 State Street
Santa Barbara, CA 93101
United States
DUNS: 062090113
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 David Mavis
 Principal Investigator
 (505) 768-7632
Business Contact
 Scot Fires
Title: Director of Contracts
Phone: (805) 963-8761
Research Institution

Mission Research Corporation (MRC) proposes to develop and demonstrate a unique solution to SEE (Single Event Effect) problems which result in data loss in deep submicron microcircuits in space radiation environments. As circuit fabrication feature sizesdecrease, SEE related upsets (which increase as the square of the inverse feature size) represent the radiation-induced hazard most difficult to avoid in spaceborne microelectronics systems. We will fully develop, and reduce to engineering practice, aunique hardening technique which we refer to as a

* Information listed above is at the time of submission. *

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