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STTR Phase I:Snapshot, on-machine metrology system for high-precision optical manufacturing

Award Information
Agency: National Science Foundation
Branch: N/A
Contract: 2322208
Agency Tracking Number: 2322208
Amount: $274,524.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: M
Solicitation Number: NSF 23-515
Solicitation Year: 2023
Award Year: 2023
Award Start Date (Proposal Award Date): 2024-10-01
Award End Date (Contract End Date): 2025-09-30
Small Business Information
4815 N Rock Canyon Road
Tucson, AZ 85750
United States
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Rongguang Liang
 (520) 906-8788
Business Contact
 Rongguang Liang
Phone: (520) 906-8788
Research Institution
 University of Arizona
845 N PARK AVE RM 538
TUCSON, AZ 85721
United States

 Nonprofit College or University

The broader/commercial impact of this Small Business Technology Transfer (STTR) Phase I project advances precision manufacturing. The on-machine metrology system will have a transformative effect on highly efficient and precise optical manufacturing, additive manufacturing, and precision machining. These industries currently face a shared technical challenge: the lack of real-time quality control during fabrication.The on-machine metrology tool's real-time quality control capabilities will not only drive efficiency in high-precision manufacturing but also contribute to reduced manufacturing costs and enhanced product quality. Overall, the project's anticipated outcomes include an efficient high throughput manufacturing process with on-machine metrology, the development of a compact, snapshot, multi-wavelength on-machine metrology system, and the establishment of a next-generation innovation and entrepreneurship training program. _x000D_
This STTR project seeks to develop a compact, snapshot, dual-mode, multi-wavelength interferometric system for in situ metrology in high precision manufacturing. The lack of real-time quality control during fabrication is a critical hurdle, leading to delays and manufacturing errors. This system integrates unique techniques to overcome this challenge and enhance throughput and accuracy. The technology utilizes a polarization-based, multi-wavelength, snapshot technique providing real-time measurements of machined surfaces with minimal environmental impacts. By offering instant feedback on surface quality, reducing iterations for diamond tool centering, and improving throughput and accuracy, the system becomes the smallest interferometric system suitable for integration into existing equipment for in situ metrology. The project's goal is to develop a market-ready, on-machine metrology system through prototyping, software development, and performance validation. This real-time, in-situ metrology process is estimated to achieve efficiency improvements of 30% or more in diamond-tool alignment and 50% or more in surface metrology. Successful development and commercialization of this system will hold significant intellectual merit, overcoming a critical hurdle in high-precision manufacturing and enabling real-time quality control._x000D_
This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

* Information listed above is at the time of submission. *

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