Built-In Filament Control for Long Lifetime in Broad Area Diode Lasers

Award Information
Agency:
Department of Defense
Branch
Defense Advanced Research Projects Agency
Amount:
$1,046,609.00
Award Year:
2008
Program:
STTR
Phase:
Phase II
Contract:
W31P4Q-08-C-0372
Award Id:
77886
Agency Tracking Number:
06ST1-0081
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
5408 NE 88th Street, Bldg E, Vancouver, WA, 98665
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
799811646
Principal Investigator:
Paul Leisher
Device Engineer
(360) 907-8347
paul.leisher@nlight.net
Business Contact:
Jake Bell
Vice President, Defense Group
(360) 713-5230
jake.bell@nlight.net
Research Institution:
UNIV. OF ILLINOIS AT URBANA-CH
Kent D Choquette
208 N. Wright Street
Urbana, IL, 61801
(217) 265-0563
Nonprofit college or university
Abstract
In this Phase 2 program, nLight intends to demonstrate high-reliability / high-efficiency 808-nm broad area diode lasers. The root-cause of the failure modes of diode lasers investigated under Phase 1 will be addressed in this program. Collaborative work on built-in filament control by etching holes will continue in this program. Prototype designs first demonstrated by focused ion beam processing (a known reliability hazard) at UIUC will be optimized and fabricated using wafer-scale processing techniques which are amenable to high-reliability operation. The primary technical objective of this program is the demonstration of a high-efficiency (>65%) laser diode bar operating at 808-nm rated at 200 W with a > 15,000-hr operation lifetime (MTTF), qualified with a high degree of statistical confidence.

* information listed above is at the time of submission.

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