Trusted IC System Utilizing IDDQ Fingerprints

Award Information
Agency:
Department of Defense
Branch
Defense Advanced Research Projects Agency
Amount:
$98,991.00
Award Year:
2005
Program:
SBIR
Phase:
Phase I
Contract:
W31P4Q-06-C-0071
Award Id:
74331
Agency Tracking Number:
05SB2-0354
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
11409 Valley View Road, Eden Prairie, MN, 55344
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
114264351
Principal Investigator:
James Deak
Senior Physicist
(952) 996-1636
jdeak@nve.com
Business Contact:
Richard George
CFO
(952) 996-1602
dickg@nve.com
Research Institution:
n/a
Abstract
This Phase I SBIR program will determine the feasibility of a unique sensor and test technology that measures trust levels in the operation of analog or digital integrated circuits (IC) through the use of device specific quiescent current (IDDQ) fingerprints. The IDDQ sensor is based on microelectronic magnetic field sensors, which are inexpensive, highly versatile, wide dynamic range, non-perturbative, and low power. The IDDQ sensor can be added to existing ICs at the wafer level, or it could be used to externally and non-destructively monitor an IC through current consumption. The IDDQ sensor operates by measuring the stray magnetic fields generated by current carrying interconnects or integrated components. The test portion of the technology compares a measured IDDQ fingerprint with an IDDQ fingerprint defined for a trusted circuit. Statistical analysis of the difference between the trusted and untrusted signatures is used to determine the trust level. Additionally, the test method permits the generation of unique, hidden, test sequence dependent, identification codes for any IC due to the effect of manufacturing process deviations and IDDQ hysteresis on the IDDQ fingerprint. The identification code can be used for forensic and system-level anti-tamper applications.

* information listed above is at the time of submission.

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