LASER SPECKLE INTERFEROMETRIC MICROSCOPE

Award Information
Agency: National Science Foundation
Branch: N/A
Contract: N/A
Agency Tracking Number: 14371
Amount: $47,669.00
Phase: Phase I
Program: SBIR
Awards Year: 1991
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
1206 Lanier Blvd Ne, Atlanta, GA, 30306
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Kenneth Q. Lao
 President
 () -
Business Contact
Phone: () -
Research Institution
N/A
Abstract
NOVA TECHNOLOGY, INC. IS INVESTIGATING THE USE OF AN OPTICAL SETUP SIMILAR TO A TWYMAN-GREEN INTERFEROMETER, A LASER BEAM TO ILLUMINATE A MICROSCOPE SPECIMEN AND A REFERENCE SURFACE, IN THE SCATTERED LIGHT FROM THE SPECIMEN IS MIXED WITH THE SCATTERED LIGHT FROM THE REFERENCE SURFACEAT THE IMAGE PLANE OF THE MICROSCOPE. BY MONITORING THE SPECKLE INTENSITY WITH A CCD ARRAY, THE PHASE CHANGE IN SPECKLE IS DETECTED FOR SURFACE DISPLACEMENT MEASUREMENT. INTERMITTENTLY THE REFERENCE ILLUMINATION IS BLOCKED OFF SO THAT SURFACE DEFORMATION CAN BE MAPPED USING A SPECKLE PATTERN CORRELATION TECHNIQUE. IN ADDITION, THE MICROSCOPE CAN BE ILLUMINATED BY AN INCOHERENT LIGHT SOURCE FOR CONVENTIONAL IMAGING. THE IMAGES FROM THREE DIFFERENT OPERATING MODES ARE THEN PROCESSED AND INTEGRATED FOR DISPLAY.

* Information listed above is at the time of submission. *

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