SURFACE FIGURE MEASUREMENTS OF X-RAY OPTICS

Award Information
Agency:
Department of Energy
Branch
n/a
Amount:
$315,000.00
Award Year:
1987
Program:
SBIR
Phase:
Phase II
Contract:
n/a
Agency Tracking Number:
3440
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
Optel Systems/optel
317 Main Street, East Rochester, NY, 14445
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
n/a
Principal Investigator:
Dr. Thomas C. Bristow
Principal Investigator
(716) 385-6760
Business Contact:
() -
Research Institution:
n/a
Abstract
THIS PROPOSAL PRESENTS A RESEARCH PLAN FOR THE MEASUREMENT OF SURFACE FIGURE OF X-RAY OPTICAL COMPONENTS ON AN IN-PROCESS BASIS. THIS MEASUREMENT IS USEFUL DURING THE FABRICATION OF X-RAY OPTICAL COMPONENTS, ESPECIALLY SINCE THE PROPOSED MEASUREMENT IS NON-CONTACTING AND CAN MEASURE ALOW REFLECTANCE, OR UNCOATED SURFACE. THE LACK OF PRECISE SURFACE FIGURE CAN EFFECT THE PERFONNANCE OF X-RAY OPTICAL COMPONENTS. ALSO THE TIME IN REMOVING THE OPTIC AND THEN PERFORMING THE TEST CAN ADD SUBSTANTIALLY TO THE FABRICATIONEFFORT. THE PROPOSED RESEARCH PROGRAM IN PHASE I IS TO DEVELOP A TECHNIQUE FOR THE MEASUREMENT OF SURFACE FIGURE ONX-RAY OPTICAL COMPONENTS USING NON-CONTACT OPTICAL SCANNING INTERFEROMETRY IN THE POLISHING CYCLE. THE EFFECTS OF THE SIGNAL TO NOISE RATIO, FOCUSING ERRORS AND FIBRATION EFFECTSWILL BE STUDIED FOR A STATIONARY OPTIC LOCATED ON A POLISHING MACHINE. THE ANTICIPATED RESULT OF THE PHASE I RESEARCH WILL BE THE CHARACTERIZATION OF AN OPTICAL COMPONENT UNDER CONDITIONS SIMILAR TO THE OPTICAL SHOP. THEIMPLICATION OF THIS RESEARCH IS THE POTENTIAL FOR A RAPID NON-CONTACTING MEASUREMENT TECHNIQUE OF SURFACE FIGURE OF A FINISHED X-RAY MIRROR OR UNCOATED X-RAY MIRROR SUBSTRATE. THE POTENTIAL APPLICATION OF THIS RESEARCH IS THE DEVELOPMENT OF NEW MEASUREMENT TECHNIQUES AND TEST EQUIPMENTFOR THE X-RAY OPTICAL FABRICOTION INDUSTRY. THESE NEW MEASUREMENT TECHNIQUES AND TEST EQUIPMENT WILL HAVE THE POTENTIAL TO IMPROVE THE QUALITY OF X-RAY OPTICAL COMPONENTS.

* information listed above is at the time of submission.

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