MINIATURIZED ELECTRO/MAGNETO-OPTIC SENSORS FOR THE DETECTION AND MEASUREMENT OF BROADBAND RF PULSES

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA9550-05-C-0174
Agency Tracking Number: F045-025-0282
Amount: $739,484.00
Phase: Phase II
Program: STTR
Awards Year: 2006
Solitcitation Year: 2004
Solitcitation Topic Code: AF04-T025
Solitcitation Number: N/A
Small Business Information
OPTEOS, INC.
1340 Eisenhower place, Ann Arbor, MI, 48108
Duns: 136578114
Hubzone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Kyoung Yang
 President
 (734) 973-6600
 kyoung@opteos.us
Business Contact
 Kyoung Yang
Title: President
Phone: (734) 973-6600
Email: kyoung@opteos.us
Research Institution
 UNIV. OF MICHIGAN
 Anna M Schork
 Division of Research Developme
1070 Wolverine Tower
Ann Arbor, MI, 48109
 (734) 764-7250
 Nonprofit college or university
Abstract
An innovative, high-speed electromagnetic-wave-detection system based on broadband, non-intrusive, miniaturized electro-optic (EO), magneto-optic (MO), and electro-optic voltage (EOV) sensors will be developed for evaluating the effects that pulsed electromagnetic (EM) waves have on specific components of electronic systems. The suite of optically-interrogated sensors, which may be positioned within close proximity to the circuit element under observation, will be interchangeable from an external port of a single optical mainframe unit. In the optical mainframe, a continuous-wave laser source and a high-speed photoreceiver will be employed in order to achieve the instantaneous measurement bandwidth required for DoD applications. The hardware, as well as the control/data acquisition software for the sensor system, will both be developed during the STTR Phase II. Upon its successful realization through the effort of this STTR project, the EO/MO/EOV sensor system is expected to provide an unprecedented capability for EM monitoring of integrated electrical systems that are exposed to externally generated, time-varying EM waves. The information from the EM-pulse-detection system will reveal the actual EM transients that are created by incident RF pulses and that reach the components of interest, exposing the signals that may lead to temporary malfunctions or permanent damage of sophisticated electronic systems.

* information listed above is at the time of submission.

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