MINIATURIZED ELECTRO/MAGNETO-OPTIC SENSORS FOR THE DETECTION AND MEASUREMENT OF BROADBAND RF PULSES

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$99,991.00
Award Year:
2004
Program:
STTR
Phase:
Phase I
Contract:
FA9550-04-C-0079
Award Id:
67965
Agency Tracking Number:
F045-025-0282
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
1340 Eisenhower place, Ann Arbor, MI, 48108
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
136578114
Principal Investigator:
KyoungYang
President
(734) 973-6600
kyoung@opteos.us
Business Contact:
KyoungYang
President
(734) 973-6600
kyoung@opteos.us
Research Institute:
University of Michigan
John F Whitaker
CUOS (IST Bldg), 2200 Bonisteel Blvd., Rm. 1006
Ann Arbor, MI, 48109
(734) 763-1324
Nonprofit college or university
Abstract
An innovative electromagnetic wave detection and measurement system based on broadband, non-intrusive, miniaturized electro-optic (EO) and magneto-optic (MO) sensors will be developed in order to evaluate the effects caused by short duration burst or pulsed EM waves incident on electronic circuits. Due to the compact size and non-metallic construction, the EO and MO sensors can be placed within close proximity to the circuit under observation, and their measurement bandwidth and spatial resolution can be greater 100 GHz and less than 10 microns, respectively. The EO and MO sensors will be designed and fabricated during the Phase I of STTR project, and entire system hardware and software development will be completed during the Phase II. Upon its successful realization through the effort of this STTR project, the EO/MO sensor system is expected to provide an unprecedented capability for EM monitoring of complex electronics in a broad range of applications, particularly when the electronics are exposed to externally generated time-varying EM waves. The information from the EO/MO sensor system will reveal the actual EM transients created by incident RF pulses, where such signals may lead to temporary malfunction or permanent damage of sophisticated electronic systems.

* information listed above is at the time of submission.

Agency Micro-sites


SBA logo

Department of Agriculture logo

Department of Commerce logo

Department of Defense logo

Department of Education logo

Department of Energy logo

Department of Health and Human Services logo

Department of Homeland Security logo

Department of Transportation logo

Enviromental Protection Agency logo

National Aeronautics and Space Administration logo

National Science Foundation logo
US Flag An Official Website of the United States Government