Nonlinear-Optical-Based Vector Electric and Magnetic Near-Field Probing for Analysis of Electromagnetic Compatibility

Award Information
Agency: Department of Defense
Branch: Army
Contract: W911NF-04-C-0075
Agency Tracking Number: A045-014-0264
Amount: $100,000.00
Phase: Phase I
Program: STTR
Awards Year: 2004
Solicitation Year: 2004
Solicitation Topic Code: A04-T014
Solicitation Number: N/A
Small Business Information
OPTEOS, INC.
1340 Eisenhower place, Ann Arbor, MI, 48108
DUNS: 136578114
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Kyoung Yang
 President
 (734) 973-6600
 kyoung@opteos.us
Business Contact
 Kyoung Yang
Title: President
Phone: (734) 973-6600
Email: kyoung@opteos.us
Research Institution
 University of Michigan
 John F Whitaker
 CUOS (IST Bldg.), 2200 Bonisteel Blvd., Rm. 1006
Ann Arbor, MI, 48109
 (734) 763-1324
 Nonprofit college or university
Abstract
The determination of the feasibility of utilizing optically-interrogated electro-optic and magneto-optic sensors as the front-end of a new, near-field characterization system for measuring time-varying, non-sinusoidal signals in microwave digital and mixed-signal circuits is proposed. The extraction of complex signals from the internal nodes of circuits or larger systems such as multi-chip modules will be crucial to the advancement of technologies needed to increase information capacity while decreasing system size and cost. Thus, impending requirements to access either very high time resolutions or the very high frequencies of harmonics in high-data-rate systems will be addressed by the proposed approach, with a bandwidth goal extending through the millimeter-wave regime to greater than 100 GHz. Emphasis will be placed on making high spatial resolution vector measurements with negligible invasiveness while in close proximity to the surface of circuits in order that near-field signal information can be used to determine the far-field radiation emitted by the circuit or a particular portion of the circuit. The feasibility of exploiting this unique knowledge of the local field for the determination of the electromagnetic compatibility (EMC) of devices and circuits will be explored.

* information listed above is at the time of submission.

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