Nonlinear-Optical-Based Vector Electric and Magnetic Near-Field Probing for Analysis of Electromagnetic Compatibility

Award Information
Agency:
Department of Defense
Branch
Army
Amount:
$100,000.00
Award Year:
2004
Program:
STTR
Phase:
Phase I
Contract:
W911NF-04-C-0075
Award Id:
68434
Agency Tracking Number:
A045-014-0264
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
1340 Eisenhower place, Ann Arbor, MI, 48108
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
136578114
Principal Investigator:
Kyoung Yang
President
(734) 973-6600
kyoung@opteos.us
Business Contact:
Kyoung Yang
President
(734) 973-6600
kyoung@opteos.us
Research Institute:
University of Michigan
John F Whitaker
CUOS (IST Bldg.), 2200 Bonisteel Blvd., Rm. 1006
Ann Arbor, MI, 48109
(734) 763-1324
Nonprofit college or university
Abstract
The determination of the feasibility of utilizing optically-interrogated electro-optic and magneto-optic sensors as the front-end of a new, near-field characterization system for measuring time-varying, non-sinusoidal signals in microwave digital and mixed-signal circuits is proposed. The extraction of complex signals from the internal nodes of circuits or larger systems such as multi-chip modules will be crucial to the advancement of technologies needed to increase information capacity while decreasing system size and cost. Thus, impending requirements to access either very high time resolutions or the very high frequencies of harmonics in high-data-rate systems will be addressed by the proposed approach, with a bandwidth goal extending through the millimeter-wave regime to greater than 100 GHz. Emphasis will be placed on making high spatial resolution vector measurements with negligible invasiveness while in close proximity to the surface of circuits in order that near-field signal information can be used to determine the far-field radiation emitted by the circuit or a particular portion of the circuit. The feasibility of exploiting this unique knowledge of the local field for the determination of the electromagnetic compatibility (EMC) of devices and circuits will be explored.

* information listed above is at the time of submission.

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