PRECISION METROLOGY FOR A MICHELSON INTERFEROMETER

Award Information
Agency:
Department of Defense
Amount:
$49,637.00
Program:
SBIR
Contract:
N/A
Solitcitation Year:
N/A
Solicitation Number:
N/A
Branch:
Air Force
Award Year:
1987
Phase:
Phase I
Agency Tracking Number:
6214
Solicitation Topic Code:
N/A
Small Business Information
Optra Inc
83 Pine St, Peabody, MA, 01960
Hubzone Owned:
N
Woman Owned:
N
Socially and Economically Disadvantaged:
N
Duns:
N/A
Principal Investigator
 GEERT J WYNTJES
 (617) 535-7670
Business Contact
Phone: () -
Research Institution
N/A
Abstract
TO MAKE A MICHELSON INTERFEROMETER SPECTROMETER VIABLE AT SHORT AND VERY SHORT OPTICAL WAVELENGTHS REQUIRES A SUPERB METROLOGY SYSTEM CAPABLE OF ACQUIRING AND MAINTAINING ALIGNMENT BETWEEN MIRRORS TO A SMALL FRACTION OF THE WAVELENGTH. OPTRA HAS DEMONSTRATED THAT IN THE INFRA-RED PART OF THE SPECTRUM A METROLOGY SYSTEM BASED UPON A 2FREQUENCY-HENE LASER CAN BE HIGHLY EFFECTIVE FOR THIS PURPOSE. SUCH A LASER, IN EFFECT SIMULATES A CONSTANT, CONTINUOUS AND HIGH DIFFERENTIAL MIRROR VELOCITY WITH A VELOCITY DETERMINED BY THE LASER DIFFERENCE, BEAT OR HETERODYNE FREQUENCY. THIS MAKES IT POSSIBLE TO MEASURE MIRROR POSITION, TRAVEL AND TILT AT A RATE VIRTUALLY INDEPENDENT OF MIRROR SCAN VELOCITY AND/OR DIRECTION. OPTRA PROPOSES TO DEMONSTRATE THAT BY OPTIMIZING CAPTURE RANGE, ELECTRICAL BANDWIDTH AND RADIOMETRY THE SAME SYSTEM CAN BE APPLIED TO A VERY SHORT WAVELENGTH INTERFEROMETER AND MAINTAIN MIRROR ALIGNMENT TO THE REQUISITE SMALL FRACTION OF A WAVELENGTH. THIS WILL MAINTAIN THE INTERFEROMETER MODULATION OR CHOPPING EFFICIENCY AT A HIGH LEVEL, A FACTOR OF CRITICAL IMPORTANCE FOR ANY PHOTON NOISE LIMITED MULTIPLEX SPECTROMETER.

* information listed above is at the time of submission.

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