Focused Ion Beam (FIB) Resistant Systems

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8650-06-M-8062
Agency Tracking Number: O053-A03-1135
Amount: $99,990.00
Phase: Phase I
Program: SBIR
Awards Year: 2006
Solicitation Year: 2005
Solicitation Topic Code: OSD05-A03
Solicitation Number: 2005.3
Small Business Information
350 Wynn Drive, Huntsville, AL, 35805
DUNS: 031994218
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Joeseph Frederick
 Principal Investigator
 (937) 320-0951
Business Contact
 Victor Balch
Title: Director of Contracts
Phone: (256) 489-8966
Research Institution
The objective of this research is to develop and demonstrate a nanoparticle-loaded thin film that can detect and discriminate X-ray and focused ion beam (FIB) radiation for tamper protection. The film can be micro-patterned directly onto electronic packages as an anti-tamper (AT) device. Research will include illuminating the film with X-ray or FIB radiation that will produce flashes of light which can be detected with on-chip optoelectronics. The film material can be patterned onto nanoporous ceramic that is used in the electronic component packaging process. Successful research and development could allow this film to be applied to the surface of the component ceramic cap and to the underside of the chip to provide low profile protection against X-ray and FIB attacks. It can also be embedded in the chip ceramic cap material where it would remain latent until it senses interrogation by X-ray or FIB radiation. The film requires no maintenance and since the material is highly stable it carries an extensive shelf life.

* information listed above is at the time of submission.

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