Focused Ion Beam (FIB) Resistant Systems

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$1,747,080.00
Award Year:
2007
Program:
SBIR
Phase:
Phase II
Contract:
FA8650-07-C-8104
Agency Tracking Number:
O053-A03-1135
Solicitation Year:
2005
Solicitation Topic Code:
OSD05-A03
Solicitation Number:
2005.3
Small Business Information
RADIANCE TECHNOLOGIES, INC.
350 Wynn Drive, Huntsville, AL, 35805
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
031994218
Principal Investigator:
Joseph Frederick
Principal Investigator
(937) 320-0966
jfrederick@radiancetech.com
Business Contact:
Victor Balch
Director of Contracts
(256) 489-8966
vbalch@radiancetech.com
Research Institution:
n/a
Abstract
Proof of concept of a thin transparent polymer film that is responsive to FIB and x-ray radiation has been demonstrated in Phase I. The objective of this Phase II research project is to continue the development of this thin film scintillator material to improve its performance, apply it to selected prototype devices, and reduce the risk of manufacture, commercialization and militarization. In Phase I it was clearly shown that the scintillator material provides for detection and discrimination of interrogating FIB or x-ray radiation. Phase II will pursue advanced development of the thin film and associated optoelectronics. The design will be optimized, fabricated, and integrated into a militarized or commercialized demonstration test article. It will be shown to mitigate the effectiveness of these types of reverse engineering threats and be economically producible. The thin film sensor is low profile, efficient, responsive, and highly stable for long operational lifetime.

* information listed above is at the time of submission.

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