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Focused Ion Beam (FIB) Resistant Systems

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: FA8650-07-C-8104
Agency Tracking Number: O053-A03-1135
Amount: $1,747,080.00
Phase: Phase II
Program: SBIR
Solicitation Topic Code: OSD05-A03
Solicitation Number: 2005.3
Solicitation Year: 2005
Award Year: 2007
Award Start Date (Proposal Award Date): 2007-04-17
Award End Date (Contract End Date): 2010-08-17
Small Business Information
350 Wynn Drive
Huntsville, AL 35805
United States
DUNS: 031994218
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Joseph Frederick
 Principal Investigator
 (937) 320-0966
Business Contact
 Victor Balch
Title: Director of Contracts
Phone: (256) 489-8966
Research Institution

Proof of concept of a thin transparent polymer film that is responsive to FIB and x-ray radiation has been demonstrated in Phase I. The objective of this Phase II research project is to continue the development of this thin film scintillator material to improve its performance, apply it to selected prototype devices, and reduce the risk of manufacture, commercialization and militarization. In Phase I it was clearly shown that the scintillator material provides for detection and discrimination of interrogating FIB or x-ray radiation. Phase II will pursue advanced development of the thin film and associated optoelectronics. The design will be optimized, fabricated, and integrated into a militarized or commercialized demonstration test article. It will be shown to mitigate the effectiveness of these types of reverse engineering threats and be economically producible. The thin film sensor is low profile, efficient, responsive, and highly stable for long operational lifetime.

* Information listed above is at the time of submission. *

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