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Focused Ion Beam (FIB) Resistant Systems
Title: Principal Investigator
Phone: (937) 320-0966
Email: jfrederick@radiancetech.com
Title: Director of Contracts
Phone: (256) 489-8966
Email: vbalch@radiancetech.com
Proof of concept of a thin transparent polymer film that is responsive to FIB and x-ray radiation has been demonstrated in Phase I. The objective of this Phase II research project is to continue the development of this thin film scintillator material to improve its performance, apply it to selected prototype devices, and reduce the risk of manufacture, commercialization and militarization. In Phase I it was clearly shown that the scintillator material provides for detection and discrimination of interrogating FIB or x-ray radiation. Phase II will pursue advanced development of the thin film and associated optoelectronics. The design will be optimized, fabricated, and integrated into a militarized or commercialized demonstration test article. It will be shown to mitigate the effectiveness of these types of reverse engineering threats and be economically producible. The thin film sensor is low profile, efficient, responsive, and highly stable for long operational lifetime.
* Information listed above is at the time of submission. *