Low Profile Multi-Mode Tamper Detection Sensors

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$749,996.00
Award Year:
2007
Program:
SBIR
Phase:
Phase II
Contract:
FA8650-07-C-8102
Agency Tracking Number:
O053-A01-1128
Solicitation Year:
2005
Solicitation Topic Code:
OSD05-A01
Solicitation Number:
2005.3
Small Business Information
RADIANCE TECHNOLOGIES, INC.
350 Wynn Drive, Huntsville, AL, 35805
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
031994218
Principal Investigator:
Joseph Frederick
Principal Investigator
(937) 320-0966
jfrederick@radiancetech.com
Business Contact:
Victor Balch
Director of Contracts
(256) 489-1742
vbalch@radiancetech.com
Research Institution:
n/a
Abstract
A multi-layered approach to tamper detection is emerging that consists of two complementary sensor technologies: micro-electro-mechanical-system (MEMS) vibrational sensors to detect acoustic and grinding threats, and a nanoparticle-doped thin film sensor that is responsive to x-ray and focused ion beam (FIB) radiation. The sensors not only will detect an attack, but also characterize it, and a report or a penalty response may be invoked. The size of these cantilevers will allow multiple redundancies for multiple frequencies without impacting the host device. In Phase I it was clearly demonstrated that multiple micro-cantilever beam arrays can be designed that will cover multiple frequency bands. The thin film is covert, requires no maintenance, does not affect the performance of the device being protected, is projected to be inexpensive to fabricate and apply, and since the material chemistry is highly stable, it should have a long shelf life. Importantly, since these technologies do not affect the performance of the device, they are applicable to legacy as well as new systems. Phase II will continue the advanced development of these technologies, leading to a product that is producible and cost-effective for military or commercial uses.

* information listed above is at the time of submission.

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