PACKAGE ELECTROSTATIC DISCHARGE (ESD) SUSCEPTABILITY

Award Information
Agency:
Department of Defense
Branch:
Navy
Amount:
$47,000.00
Award Year:
1986
Program:
SBIR
Phase:
Phase II
Contract:
N/A
Agency Tracking Number:
2295
Solicitation Year:
N/A
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Small Business Information
Reliability Sciences Inc.
2361 S Jefferson Davis Hwy - M, Arlington, VA, 22202
Hubzone Owned:
N
Socially and Economically Disadvantaged:
N
Woman Owned:
N
Duns:
N/A
Principal Investigator
 Spyros A Vrachnas
 (703) 979-1414
Business Contact
Phone: () -
Research Institution
N/A
Abstract
SINCE THE EARLY 1960'S, IT HAS BEEN RECOGNIZED THAT "ELECTROSTATIC DISCHARGE" (ESD) CAN DAMAGE ELECTRONIC PARTS. WITH THE PROGRESSIVE MICROMINIATURIZATION OF ELECTRONICS, MORE AND MORE PARTS BECOME SUSCEPTIBLE TO DAMAGE FROM ESD. THE TREND TOWARDS GREATER MICROMINIATURIZATION AND MORE COMPLEX DEVICES (E.G., VLSI AND VHSI) WILL RESULT IN ESD BECOMING AN EVEN MORE SIGNIFICANT PROBLEM IN THE FUTURE.TODAY MOST MICROCIRCUITS, LOW POWER DISCRETE SEMICONDUCTORS, AND THICK AND THIN FILM DEVICES ARE SUSCEPTIBLE TO DAMAGE FROM ESD. THIS DAMAGE CAN OCCUR DURING MANUFACTURE, ASSEMBLY, TEST, HANDLING, OR USE OF THE COMPONENT OR ASSEMBLY. THE DETERMINATION OF SENSITIVITY BY PACKAGE TYPE COULD RESULT IN USING THE LEAST SENSITIVE PACKAGE TYPE AND REDUCING OVERALL DAMAGE TO ESD SENSITIVE DEVICES. DETERMINATION OF PACKAGE SENSITIVITY REQUIRES CONTROLLED EXPERIMENTS AND DETERMINATION OF RELATIVE AGNITUDE OF ELECTROSTATIC CHARGE, FIELD STRENGTH DEVICE ORIENTATION, MATERIALS AND GROUNDING OF SURFACES ON WHICH DEVICES ARE TESTED.

* information listed above is at the time of submission.

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