Improving Electronic Circuit and System Reliability Using Embedded Prognostics

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-FG03-01ER83300
Agency Tracking Number: 65673B01-I
Amount: $99,964.00
Phase: Phase I
Program: SBIR
Awards Year: 2001
Solicitation Year: 2001
Solicitation Topic Code: 12c
Solicitation Number: N/A
Small Business Information
7070 North Oracle Road, Suite 120, Tucson, AZ, 85704
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Harold Parks
 Principal Investigator
 (520) 621-6180
Business Contact
 Harold Parks
Title: Principal Investigator
Phone: (520) 621-6180
Research Institution
65673 Reliability prognostic monitors, needed in nuclear physics electronic systems, must be self-contained predictors of an impending circuit/system failure at the device/sub-circuit level. This project will develop circuits capable of functioning as prognostic cells for dynamic AC oxide failure, for dynamic AC hot carrier damage, and for radiation damage. In Phase I, the functionality of each cell will be demonstrated using simulation. The starting point for the development of the AC oxide failure cell will be the existing static oxide failure cell. The starting point for the development of both the AC hot carrier damage and the radiation damage prognostic cell will be the existing static hot carrier damage cell. Prototype demonstrators for each prognostic cell will be built and fully evaluated during Phase II. Commercial Applications And Other Benefits as described by the awardee: The availability of reusable, pre-designed, pre-tested prognostic cells for common semiconductor failure modes should find wide applicability in automotive, medical and industrial process control applications. For automotive applications, an electronics control module about to become defective could be identified before failure and replaced as part of the vehicle¿s periodic maintenance program. In medical applications, a heart pacemaker could be replaced in a patient prior to a catastrophic problem. For process control applications, disasters can be averted by switching to backup process controllers when an upcoming failure event is predicted.

* Information listed above is at the time of submission. *

Agency Micro-sites

SBA logo
Department of Agriculture logo
Department of Commerce logo
Department of Defense logo
Department of Education logo
Department of Energy logo
Department of Health and Human Services logo
Department of Homeland Security logo
Department of Transportation logo
Environmental Protection Agency logo
National Aeronautics and Space Administration logo
National Science Foundation logo
US Flag An Official Website of the United States Government